We are a laboratory specializing in Scanning Electron Microscopy, SEM, as well as Energy Dispersive x-Ray Microanalysis, EDX. We focus on solving issues related to the PWB industry.
Ma-tek is aimed to be the first tier service lab in the professional field of materials and failure analysis service. Applying a variety of analytical techniques, ma-tek is able to engage the best R&D partnership with customers in high tech industry.
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New Equipment | Industrial Automation
Sandy.[mailto:unity@mvme.cn] Sandy.[WhatsApp/Skype/Mobile:+8618020776786] Sandy.[Quote to you within the shortest possible time with our best price] Warranty: up to 12 months Shipping: fast delivery is available NEW+ORIGINAL+IN STOCK+ONE
Electronics Forum | Mon Jun 25 03:52:24 EDT 2012 | awtm
Our Customer had detected tarnished pad on ImAg PCBA and had conducted several SEM-EDX test at the soldermask below some of the chip resistors. High concentration of sulfur was found and it can be significantly reduced after further chemical cleaned
Electronics Forum | Mon Aug 19 04:48:27 EDT 2002 | surachai
I'm not found this problem with adhesive but found in NC flux , Then you should get some residue and analyse it by SEM and EDX for specify the actual source ( flux or adhesive ? ) , if it 's from adhesive , sometime your supplier must join this pro
Industry News | 2011-04-07 20:43:37.0
Nihon Superior Co. Ltd., a supplier of advanced soldering materials to the global market, announces that Keith Howell, Technical Director, will present a paper titled "Assessment of Microalloyed Sn-Zn as a Solder for Electronics Assembly" at the upcoming International Conference on Soldering & Reliability (ICSR).
Industry News | 2015-01-09 11:28:58.0
Datest, a leading provider of advanced, efficient and mission-critical in-circuit testing, test engineering, and X-ray inspection solutions, will exhibit in Booth #760 at MD&M West, scheduled to take place February 10-12, 2015 at the Anaheim Convention Center in California.
Technical Library | 2023-12-26 17:50:54.0
In this white paper, we discuss the pros and cons of five analytical techniques when applied to residue analysis on electronic assemblies. We evaluate the following for their application and limitations for analyzing both visible and invisible residues: FITR, SEM/EDX, XRF, Ion Chromatography, and ROSE
Technical Library | 2018-04-18 23:55:01.0
Higher functionality, higher performance and higher reliability with smaller real estate are the mantras of any electronic device and the future guarantees more of the same. In order to achieve the requirements of these devices, designs must incorporate fine line and via pitch while maintain good circuitry adhesion at a smooth plating-resin interface to improve signal integrity. The Semi-Additive Process (SAP) is a production-proven method used on low dielectric loss tangent (Df) build-up materials that enables the manufacture of ultra-fine circuitry. (...) This paper will discuss a new SAP process for low loss build-up materials with low desmear roughness (Ra= 40-100 nm) and excellent adhesion (610-680 gf/cm) at various processing conditions. Along with the process flow, the current work will also present results and a discussion regarding characterization on the morphology and composition of resin and/or metal plating surfaces using scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX), surface roughness analysis, plating-resin adhesion evaluation from 90o peel tests
ACI Technologies Inc. (ACI) is a scientific research corporation dedicated to the advancement of electronics manufacturing processes and materials for The Department of Defense and industry. This video provides an overview of our commercial service
Training Courses | | | PCB Inspection Courses
The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.
Surface Mount Technology Association (SMTA) | https://www.smta.org/iceet/workshops.cfm
Plan view Through-scan Thermography Decapsulation Micro-probing Liquid crystal Emission microscopy Front side Back side Micro-sections SEM imaging Plan view Cross-sections EDX analysis Less common but useful
