Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/last-will-of-bga-void.pdf
infinity. A shape factor of less than 1.0 is generally considered to be indicative of infant mortality. Electronic components in thermal cycling that are undergoing ‘post infant mortality’ failures typically exhibit shape factors in the range of 4-8
Surface Mount Technology Association (SMTA) | https://www.smta.org/knowledge/journal.cfm
TECHNOLOGY IN PORTABLE ELECTRONICS Arni Kujala Abstract 15-2 STACKED MULTI-CHIP PACKAGING FOR THE NEXT GENERATION ELECTRONICS Vern Solberg Abstract 15-2 ELECTRICAL CHARACTERIZATION OF LEAD-FREE SOLDER SEPARABLE CONTACT INTERFACES Ji Wu and Michael Pecht