Industry Directory | Manufacturer
Electrical Test Instruments, LLC also services insulation testers, low-resistance ohmmeters, current clamp-on's, multimeters, and many more varieties of electric and measuring equipment.
Industry Directory | Distributor / Manufacturer / Manufacturer's Representative / Other
TMI is a marketing leading importer & supplier of professional test instrumentation & scientific instruments since 1985.
ProntoTEST-FIXTURE used by electronics manufacturers will accurately setup your Automatic Test Equipment (ATE), Flying Probe and design your "bed of nails" test fixturing. In minutes Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Ma
The ABI BoardMaster 8000 PLUS Universal Diagnostic System is a uniquely versatile, self-contained and easy-to-use test system. It offers the most comprehensive set of test instruments for fault-finding on almost any kind of PCB. With the full range o
Electronics Forum | Tue Dec 07 20:28:02 EST 2004 | Dreamsniper
Hi, Is there a standard expiry date for a ROSE Test Instrument Like Ionographs, Omega Meters, Zero-Ion etc.? How can I verify if my OmegaMeter 500 which is almost 20 years old is providing me reliable data during testing? Note that the equipment is
Electronics Forum | Fri Dec 10 11:05:54 EST 2004 | pjc
Contact http://www.scscookson.com they have your answer.
Used SMT Equipment | Pick and Place/Feeders
Universal Instruments 8mm DL Gold Feeders For Sale Tested in Good Working Condition Contact us for more information
Used SMT Equipment | Pick and Place/Feeders
Universal Instruments Advantis Model Number: 4984B AX-72E Year 2008 Serial Number: 10094075 7 Spindle Flex Jet 09 Magellan Camera Universal Software UPS 6.03.00 24 Volt Feeder Option Tested in Good Working Condition Feeders Available at Add
Industry News | 2003-03-10 08:41:03.0
provides an overview of the main features of both conduction coupling and radiated field coupling, the two primary RF immunity test methods.
Industry News | 2003-06-25 12:28:40.0
The chart includes a variety of diagrams, tables, and ratio charts for RF Emissions; Direct RF Power Injection; Bulk Current Injection (BCI); ESD and Transients; as well as TEM Cell and Stripline testing.
Parts & Supplies | Assembly Accessories
Introduction of kic2000 furnace temperature tester Processing customization: Yes Brand: US KIC Model: kic2000 Measurement range: - 50-1050 (℃) Temperature measurement resolution: 0.1 ℃ Dimension: 320 * 86 * 26 (mm) Packing number: 1 t
Parts & Supplies | Assembly Accessories
KIC START profiler,kic thermal profile,smt thermal profilling Image Reflow Profile 9 6 Channel Tester Accuracy: +/-1.2°C Resolution: 0.3 °C to 0.1 °C Internal operating temperature: 0 °C to 105 °C For thermocouples: 9/12 K Ty
Technical Library | 2022-05-02 21:35:53.0
Testing of electronic assemblies involves three elements: the device under test, test equipment, and fixturing to make the connections between them. The challenge for a test engineer building a sophisticated test system is that instrumentation may need to measure thousands of test points through the mechanical interconnect.
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
www.unisoft-cim.com/pcbtest.htm - In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD & BOM files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is used by Test
https://www.ascen.ltd/Products/PCB_board_assembly_system/vision_measurin/507.html Vision Measuring Machine and image measuring instrument can be used for dimensional accuracy measurement of various molds, aircraft, automobile, mobile phone, computer,
Training Courses | | | ESD Control Training Courses
Browse training and certification programs for electrostatic discharge (ESD) control in electronics assembly.
Training Courses | | | ESD Control Training Courses
Browse training and certification programs for electrostatic discharge (ESD) control in electronics assembly.
Events Calendar | Tue Feb 13 00:00:00 EST 2018 - Tue Feb 13 00:00:00 EST 2018 | Austin, Texas USA
Electronics Design, Manufacturing & Test Symposium
Events Calendar | Mon Feb 19 00:00:00 EST 2024 - Mon Feb 19 00:00:00 EST 2024 | ,
SMTA Webinar: Development of Wireless Strain Measurement for Printed Circuit Board
Career Center | San Diego, California USA | Engineering
Test Engineer in manufacturing environment. Contractor will support Sr Test engineer in new product introductions. Utilize automated In Circuit test equipment to test dual and single sided SMT boards. MUST have current experience with Agilent 3070 l
Career Center | Corpus Christi, Texas USA | Engineering,Production,Quality Control,Technical Support
Provides supervison of all Lab & Hi-rel Screening personnel along with Calibration and the Electronic Tech covering this area. Oversees all test procedures and documentation relative to testing. Works with customers and engineers as required. POSIT
Career Center | , | Engineering,Maintenance,Management,Production,Technical Support
Having 10+years of Experience in manufacturing (SMT),Field Engineer Globally For Universal SMT Equipment .
Career Center | vestal, New York USA | Quality Control
Over 7 years of experience as lead quality engineer in the filed of SMT. Extensive knowledge on Universal GSM,GC60 and GC120 Machines. worked on IBM Rational and Mercury Winruner testing tools.
SMTnet Express, June 12, 2014, Subscribers: 22834, Members: Companies: 13899, Users: 36331 Instrumentation for Studying Real-time Popcorn Effect in Surface Mount Packages during Solder Reflow Arijit Roy; World Academy of Science, Engineering
GPD Global | https://www.gpd-global.com/co_website/pdf/pbt/Wafer-Option-PBFT-PBT-3000M.pdf
Wafer Peel Back Test Wafer Peel Back Test Option Operating Guide Part No. PBT-3000M 07/19/07 ©2007 GPD 611 Hollingsworth Street, Grand Junction, CO 81505 USA tel: +1.970.245.0408 fax: +1.970.245.9674 email: request@gpd-global.com www.gpd
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! Newsletter Email Address: Click here to unsubscribe Davidson Optronics Table Instrument Stand Model D 247 ID_700067 (10/22) Home > Test and Measurement Equipment Click to enlarge More images Davidson Optronics Table Instrument Stand Model D 247 ID_700067 (10/22
