Industry News: 2sec (Page 1 of 4)

MIRTEC Corp. to Highlight the MV-7L In-Line AOI System at SMTA International 2008

Industry News | 2008-08-11 23:45:48.0

OXFORD, CT � August 2008 � MIRTEC Corp., the AOI market leader in North America, announces that it will display the MV-7L In-Line AOI System in booth 424 at the upcoming SMTA International exhibition and conference, scheduled to take place August 19-20, 2008 in Orlando. FL.

MIRTEC Corp

MIRTEC Corp. Wins a 2008 NPI Award for its MV-7L In-Line AOI System

Industry News | 2008-04-07 22:15:22.0

OXFORD, CT � March 31, 2008 � MIRTEC Corp., the AOI market leader in North America, announces that it has been awarded a 2008 NPI Award in the category of Test & Inspection, AOI for its MV-7L In-Line AOI System. The award was presented to the company during a Monday, March 31, 2008 ceremony that took place in the Mandalay Bay Resort & Convention Center in Las Vegas before the start of APEX 2008.

MIRTEC Corp

MIRTEC Receives 2008 Advanced Packaging Award for Their MV-7L In-Line AOI Machine

Industry News | 2008-07-19 15:38:37.0

OXFORD, CT � July 16, 2008 � MIRTEC, the global leader in Automated Optical Inspection Technology, announces that its MV-7L In-Line AOI System was named First Finalist in the category of Inspection Equipment & Services during the Advanced Packaging Award ceremony that took place on Wednesday, July 16, 2008 at the St. Regis Hotel Conservatory during the SEMICON West exhibition in San Francisco.

MIRTEC Corp

ViTrox Technologies Releases High-Throughput AOI Solution — V510 G2 Series

Industry News | 2012-07-18 10:12:06.0

ViTrox Technologies,introduces the G2 Series of its V510 Advanced Optical Inspection (AOI) solution. The V510 G2 Series offers powerful technologies and high-throughput productivity for SMT line production.

ViTrox Technologies

ViTrox Technologies to Debut New Capabilities of the Prized V810 X-Ray Inspection System at the IPC APEX EXPO

Industry News | 2013-01-14 11:20:58.0

ViTrox Technologies,will exhibit in Booth #2707 at the upcoming IPC APEX EXPO, scheduled to take place February 19-21, 2013 at the San Diego Convention Center in California.

ViTrox Technologies

ViTrox Technologies to Debut New Capabilities of Its V810 X-Ray Inspection System in Asia at NEPCON China 2013

Industry News | 2013-04-16 16:05:34.0

ViTrox Technologies, will exhibit in Booth #1H60 at NEPCON China 2013, scheduled to take place April 23-25, 2013 at the Shanghai World EXPO Exhibition & Convention Center.

ViTrox Technologies

Rocket EMS Ramps up Inspection with Two V510 G2 Series AOIs

Industry News | 2015-05-14 21:35:48.0

Rocket EMS today announced that it has purchased two V510 G2 Series AOI systems from ViTrox Technologies. The V510 G2 Series offers powerful technology and high throughput productivity for SMT line production.

Rocket EMS

TRI releases New Multi-Camera 3D AOI

Industry News | 2022-05-18 12:27:28.0

Test Research, Inc. (TRI) proudly announces the launch of the Multi-Camera 3D Side View AOI solution, TR7500QE Plus, performing at industry-leading speeds of up to 57 cm2/sec.

TRI - Test Research, Inc. USA

Save the Date for productronica India 2016!

Industry News | 2016-09-23 15:57:20.0

ViTrox Technologies is pleased to announce that its advanced optical inspection systems (AOI) will be presented at the coming productronica India by its strategic channel partners (SCP), Kyoritsu and iNEtest! The show takes place Sept. 21-23, 2016 at the Bangalore International Exhibition Centre. Both of the booths are located in Hall 3, Kyoritsu (#3141) and iNEtest (#3147). Highlights of the day will include the V510i 3D AOI and V510i G2S!

ViTrox Technologies

Quality AOI and SPI Inspection Solutions from CyberOptics on Display at INTERNEPCON Japan

Industry News | 2012-12-19 12:21:03.0

CyberOptics Corporation (Nasdaq: CYBE) announces that it will present its newest range of SPI and AOI inspection solutions in booth 52-9 at the upcoming INTERNEPCON Japan, scheduled to take place January 16-18, 2013 at the Tokyo Big Sight in Japan.

CyberOptics Corporation

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