Industry Directory: can node 1 error (3)

Vonsquare

Industry Directory | Consultant / Service Provider / Distributor / Manufacturer

We are VONSQUARE the start of a Smart Factory. VONSQUARE provides the standard infrastructure for SMT.

Pinsheng Electronics Co.,Ltd

Industry Directory | Consultant / Service Provider / Manufacturer

Trusted EMS Manufacturer, ISO9001, ISO14001, UL, RoHS, REACH Cheap PCB Assembly, No MOQ, Min Device 01005 HDI PCB from 4-20 Layers, Anylayer Build-up, BGA 0.25mm Quickturn Delivery Supported by 3 Plants

New SMT Equipment: can node 1 error (161)

Automatic SMT Splicing Machine BMM08G/G_Plus

Automatic SMT Splicing Machine BMM08G/G_Plus

New Equipment | Other

Automatic SMT Splicing Machine BMM08G/G_Plus Functional advantages ▶Simple operation: 5 minutes to learn to operate, everyone can operate, reducing dependence on personnel. ▶Foolproof and error-proof: Automatically scan the code to compare and prev

Qinyi Electronics Co.,Ltd

Panasonic MSHG3/MSHG2 Feeder Calibration JIG SMT Feeder Calibration

Panasonic MSHG3/MSHG2 Feeder Calibration JIG SMT Feeder Calibration

New Equipment | Pick & Place

Panasonic MSHG3/MSHG2 Feeder Calibration JIG SMT Feeder Calibration Panasonic MSHG3/MSHG2 Feeder Calibration JIG SMT Feeder Calibration Specification: Dimension:500 x 350 x 550 mm , L x W x H Type:Pneumatic / Manual Monitor : 12” LED display, with

ZK Electronic Technology Co., Limited

Electronics Forum: can node 1 error (1016)

Axis Head 1 Z Velocity error

Electronics Forum | Wed Jun 27 12:27:46 EDT 2007 | jaimebc

Same error here with our GSM1. Does your GSM have 2 heads? If so, this is how I fixed it. I didn't have a spare Z motor, so I swapped the Z motor for the front head with the rear head. Problem gone. Now since we don't use the rear head as much as we

UNIVERSAL GSM 1

Electronics Forum | Mon Apr 15 21:00:57 EDT 2013 | dman97

Hi, I have another problem. This time with a vintage 1995 GSM machine. Upon startup, I am seeing a part to pad LED tower time out. The GSM knowledge base says to change they relay at CR1 on the power distribution board. On this machine, the power

Used SMT Equipment: can node 1 error (112)

Tyco SEP 3T

Tyco SEP 3T

Used SMT Equipment | General Purpose Equipment

Year 2008 - Like New Condition Tyco SEP 3T Shuttle Electric Press Standalone electric press for the application of PCBs onto compliant pin housings or connectors • Servo electric press with shuttle system for product location under press ram • Ho

1st Place Machinery Inc.

Fuji Chip Mounter NXTR-A

Fuji Chip Mounter NXTR-A

Used SMT Equipment | Chipshooters / Chip Mounters

The NXTR A model includes an automatic feeder exchange system that frees operators from changeover and supply work, with additional features that strengthen the ability to maintain high-quality and productivity. Fuji is paving the way to the future o

Qinyi Electronics Co.,Ltd

Industry News: can node 1 error (246)

parvus Corp. Now Shipping its Biothenticator� PC/104 Biometric Fingerprint Sensor Module for Embedded System User Authentication

Industry News | 2003-03-27 08:15:33.0

Modular Embedded Circuit Board from parvus Enables Local Device Fingerprint Biometrics

SMTnet

Introbotics Announces New Board Testing Capability for Merix Corporation

Industry News | 2003-04-01 08:13:08.0

The Introbotics equipment boosts controlled impedance testing productivity and accuracy by a factor of ten compared to the handheld probing techniques.

SMTnet

Parts & Supplies: can node 1 error (74)

Fuji Calibration GIC-F01  NXT Feeder Calibration JIG

Fuji Calibration GIC-F01 NXT Feeder Calibration JIG

Parts & Supplies | Pick and Place/Feeders

GIC-F01 FUJI NXT Feeder Calibration JIG It is essential for this equipment that enhanced productivity , installation and quality improvement As the high efficiency vision camera is asked in order to investigate precisely and repair the error of

DONGGUAN KINGSUN AUTOMATION TECHNOLOGY CO.,LTD

Fuji Calibration GIC-F02  CP6 Feeder Calibration JIG

Fuji Calibration GIC-F02 CP6 Feeder Calibration JIG

Parts & Supplies | Pick and Place/Feeders

GIC-F02 FUJI CP6 Feeder Calibration JIG It is essential for this equipment that enhanced productivity , installation and quality improvement As the high efficiency vision camera is asked in order to investigate precisely and repair the error of

DONGGUAN KINGSUN AUTOMATION TECHNOLOGY CO.,LTD

Technical Library: can node 1 error (1)

Creating Reusable Manufacturing Tests for High-Speed I/O with Synthetic Instruments

Technical Library | 2020-07-08 20:05:59.0

There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.

A.T.E. Solutions, Inc.

Videos: can node 1 error (87)

Siemens SIPLACE Clean 00352931-02

Videos

03051640-01 Filter Cartridge 03051657-01 Barcode-Reader 2D ICR850-2Z1920S06 03051814-01 Adjust gauge for crah-sensor WPC 03051917-01 Gas Spring 6/15 03051949-01 GAS SPRING 03052031S01 Control computer X series 03052032S03 Machine controller X s

Qinyi Electronics Co.,Ltd

Siemens SMT SPARE PARTS SCALE X-AXIS 00301086-01

Videos

03052900S02 tape cutter pneum. SIPLACE HF / X-Series    03052927-01 CAN Node NC Tape Cutter HF/X-Series    03052954-01 Monitor Holder S u. F complete    03053145-01 USB Hub 2.0 4-Port    03053286-02 Y-Axis Cover Air Filter for 120mm Fan    03053

Qinyi Electronics Co.,Ltd

Events Calendar: can node 1 error (1)

Electronics in Harsh Environments Conference and Exhibition

Events Calendar | Tue May 17 00:00:00 EDT 2022 - Thu May 19 00:00:00 EDT 2022 | Amsterdam, Netherlands

Electronics in Harsh Environments Conference and Exhibition

Surface Mount Technology Association (SMTA)

Career Center - Resumes: can node 1 error (2)

B-Tech/4+Exp as an Service & Production

Career Center | CHENNAI, TAMILNADU India | Engineering,Maintenance,Production,Quality Control,Technical Support

4 years of hands on experience in SMT manufacturing and Process Development where my duties include Programming of SMT machines for different PCBs, operation, process study and maintenance of SMT machines.. Reflow Oven Profiling, according to new d

SMT Process Technician

Career Center | cabuyao, Philippines | Engineering

I had 9 years working as a technician starting in Smart electronic)as Mainline Technician. SGIC(Sanritsu Great International Corporation) as SMT mainline Techinician and IMI (Integrated Micro-Electronics INC,)as SMT Process Technician.

Express Newsletter: can node 1 error (998)

Partner Websites: can node 1 error (824)

FLOware Info and Error Messages Reference Guide

GPD Global | https://www.gpd-global.com/co_website/pdf/doc/FLOware-Messages-Reference-Guide-22100026.pdf

• All Rights Reserved Info & Error Messages Reference Guide For FLOware software ver 2.9.1+ Messages can provide running information about operations on the system or indicate when a problem arises

GPD Global

How Challenging Conventional Wisdom Can Optimize Solder Reflow

Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2022/04/00600-248-1.pdf

to optimizing the process. An examination of six “conventional wisdom” tenets reveals that challenging them can contribute significantly to improved yields. No. 1 — A Standard Profile

Heller Industries Inc.


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