New Equipment | Test Equipment
E5061B Main features With a wide selection of tester options, you can find the configuration that best suits your test needs: 100 kHz to 1.5 GHz/3 GHz, 2-port, 50 or 75 , transmission/reflection or S-parameter tester Measurements in the 5 Hz to
Used SMT Equipment | In-Circuit Testers
Key Features & Specifications •Plots impedance parameters •Calibration / compensation capabilities for test fixtures •Equivalent circuit analysis Description E5061B-3L5 LF-RF network analyzer option + 005 Impedance analysis option - NA plus ZA i
Used SMT Equipment | In-Circuit Testers
Description The E5061B-010 time domain/fault location analysis option allows you to locate the discontinuities and mismatches of devices such as cables. By employing the gating function in the time domain and transforming the data back to the freque
| Sm | t | net |
| 1 |
.gif)
