New Equipment | Test Equipment
AutoCAF™ is able to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 2.6.25 Test Method & IPC 9691 CAF Test Users Guide. Conductive anodic filament (CAF) failure is copper
Electronics Forum | Wed Apr 29 04:57:08 EDT 2009 | davepick
It depends on the application what will be considered the biggest issue to avoid (production or longterm reliability). Tin Whiskers are bit of an unknown quantity - but a more realistic problem could be dendritic growth / electromigration forming sho
Electronics Forum | Fri Jul 26 17:02:07 EDT 2002 | davef
Never heard of flux residues forming a lense. The first thing that comes mind when thinking about your 'fog test' is: Ionic Contamination While this seems pretty far afield from your interest in optical effects, I'll continue briefly. A reverse
Used SMT Equipment | In-Circuit Testers
Keithley 238 Keithley 238 High-Current Source-Measure Unit Key Features and Benefits: Four instruments in one (voltage source, voltage measure, current source, current measure) 10fA, 10μV measurement sensitivity 1A source and me
Used SMT Equipment | General Purpose Test & Measurement
Key Features and Benefits: Four instruments in one (voltage source, voltage measure, current source, current measure) 10fA, 10μV measurement sensitivity 1A source and measure Standard and custom sweep capability including pulse
SMTnet Express June 13, 2013, Subscribers: 26140, Members: Companies: 13397, Users: 34803 Electromigration damage mechanics of lead-free solder joints under pulsed DC: A computational model by: Wei Yao, Cemal Basaran; Electronic Packaging
