Industry News: fringes (Page 1 of 3)

Charlie Barnhart & Associates LLC (CBA) Launches Nine-Part Series of Articles for Midmarket OEMs

Industry News | 2011-08-30 19:57:17.0

Charlie Barnhart & Associates has launched a nine-part series of articles for midmarket OEMs to discuss current global conditions and the challenges they have created.

Charlie Barnhart & Associates LLC

Akrometrix LLC to Demonstrate Real-Time Analysis, Array Generation (wafer partitioning), and 2D/3D Interface Analysis Software at productronica, U.S. Pavilion Hall A3, Booth 112/1

Industry News | 2015-10-22 16:56:59.0

Akrometrix LLC will exhibit in Hall A3, Booth 112/1 at the productronica International Trade Fair, scheduled to take place Nov. 10-13, 2015 at the Messe München exhibition center in Munich, Germany. Company representatives will exhibit Akrometric’s TherMoire’ AXP modular metrology platform which provides shadow moire’, digital fringe projection, and digital image correlation capabilities in one platform. Akrometrix also will demonstrate its new Real Time Analysis Software along with Array Generation Software (for thermal warpage measurement and partitioning of wafers) and Interface Analysis software that allows high level and in-depth review of the attachment interface between two surfaces that warp during microelectronics and electronic assembly production reflow processes.

Akrometrix

Akrometrix LLC Will Discuss Thermal Warpage and Strain Metrology at APEX

Industry News | 2016-02-17 16:31:00.0

Akrometrix LLC will exhibit in Booth #1623 at the 2016 IPC APEX EXPO, scheduled to take place March 15-17, 2016 at the Las Vegas Convention Center. Company representatives will discuss Akrometric’s TherMoire’ AXP modular metrology platform that provides shadow moire’, digital fringe projection and digital image correlation capabilities in one platform. Akrometrix also will demonstrate its new Real-Time Analysis Software along with Array Generation Software (for thermal warpage measurement and partitioning of wafers) and Interface Analysis Software that allows high level and in-depth review of the attachment interface between two surfaces that warp during microelectronics and electronic assembly production reflow processes.

Akrometrix

PAC Global to Discuss Thermal Warpage and Strain Metrology Solutions from Akrometrix at Upcoming SMTA Expos

Industry News | 2016-02-18 19:59:51.0

Akrometrix will exhibit at the SMTA Houston & Dallas Expo & Tech Forums in Texas. SMTA Houston is scheduled to take place Tuesday, March 1, 2016 at the Stafford Centre and SMTA Dallas is scheduled to take place Thursday, March 3, 2016 at the Plano Centre. The PAC Global team will discuss Akrometric’s TherMoire’ AXP modular metrology platform that provides shadow moire’, digital fringe projection and digital image correlation capabilities in one platform. PAC Global also will demonstrate the new Akrometrix Real-Time Analysis Software along with Array Generation Software (for thermal warpage measurement and partitioning of wafers) and Interface Analysis Software that allows high level and in-depth review of the attachment interface between two surfaces that warp during microelectronics and electronic assembly production reflow processes.

Akrometrix

TRI Highlights Smart Factory Inspection Solutions at IPC APEX EXPO 2019

Industry News | 2019-01-06 21:27:59.0

[December 14, 2018 – San Jose, CA] Test Research, Inc. (TRI), the leading test and inspection solutions provider for the electronics manufacturing industry will join IPC APEX EXPO 2019 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the printed circuit board electronics manufacturing industry. Visit TRI at booth #2533 on January 29 – January 31, 2019 to discover the newest innovations in 3D SPI, 3D AOI, 3D CT AXI and multicore ICT.

TRI - Test Research, Inc. USA

CyberOptics to Present Technical Paper at SPIE Optics + Photonics 2020 On-Line Conference

Industry News | 2020-07-29 17:51:05.0

CyberOptics® Corporation (NASDAQ: CYBE) will present at the SPIE Optics and Photonics On-Line Conference on August 24 during the SPIE Optical Engineering and Applications Symposium's verification and alignment session from 8:20 to 10:00am.

CyberOptics Corporation

Deltec Selects 3-D SPI System from Viscom

Industry News | 2011-10-07 22:49:53.0

Deltec Automotive GmbH & Co. KG, based in Furth im Wald, has selected Viscom’s 3-D solder paste inspection system.

Viscom AG

ViTrox Technologies V510 Optimus 3D AOI Named Best Asian Product at SMTAI

Industry News | 2014-10-01 14:25:36.0

ViTrox Technologies announces that it was awarded a 2014 Global Technology Award in the category of Best Product – Asia for its V510 Optimus 3D Advanced Optical Inspection System (AOI).

ViTrox Technologies

TRI to Showcase High Resolution Inspection at Productronica India 2018

Industry News | 2018-08-08 23:59:46.0

Test Research, Inc.'s (TRI) latest Optical Inspection and Electrical Testing solutions will be displayed at Productronica India Trade Fair. Visit TRI's Booth #PB55 in Hall 3 with the cooperation of TRI's distributor, Test & Research India PVT. LTD., at BIEC, Bengaluru, India, from September 26th to 28th, 2018.

TRI - Test Research, Inc. USA

Thermal Warpage and Strain Metrology Platforms will be Displayed at GOMACTech

Industry News | 2016-02-23 19:44:33.0

Akrometrix will exhibit in Booth #108 at the GOMACTech 2016 Conference, scheduled to take place March 14-17, 2016 in Orlando, Fl. Established in 1968, the conference has focused on advances in systems being developed by the Department of Defense and other government agencies and has been used to announce major government microelectronics initiatives such as VHSIC and MIMIC, and provides a forum for government reviews.

Akrometrix

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