New Equipment | Board Handling - Conveyors
NUTEK NTM5210-M SMT Shuttle gate conveyor Product name: SMT Conveyor PCB Width: 50 to 350 mm Application: SMT PCB Assembly Production Power Supply: 1 PH AC 220V 50/60Hz Product description: NUTEK NTM5210-M SMT Shuttle gate conveyor, used betwe
The Model 505 Series Digital Delay-Pulse Generator with 2, 4 or 8 independent outputs is our most affordable digital delay/pulse generator - Ideal for applications that require moderate precision and multi-channel capability. The delay and pulsewidth
Electronics Forum | Sat May 29 02:26:14 EDT 2010 | vinitverma
If you want to vary the voltage to control the motor speed, then this is not the correct way. Though you can use LM317 for reducing the votage (using a 5K potentiometer) which will sure reduce the speed but it'll reduce the torque tremendously. For D
Electronics Forum | Wed Nov 26 07:45:24 EST 2008 | davef
Investigation of Device Damage Due to Electrical Testing, R Croughwell & J McNeill, Worcester Polytechnic Institute Abstract: This paper examines the potential failure mechanisms that can damage modern low voltage CMOS devices and their relationship
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E4416A-001 The E4416A single channel EPM-P series power meter, for peak, average, peak-to-average ratio and time-gated measurements, using the E9320 peak and average power sensors. * 20 Msample/s per second sampling rate for re
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 5361B Pulse/CW Microwave Counter, 40 GHz The Agilent 5361B Pulse/CW Microwave Counter offers both high-precision pulse and CW performance up to 40 GHz. With built-in frequency modulation profiling, the 5361B characterizes radar
Industry News | 2018-11-19 15:34:32.0
The CS448 is a unique isolated four-channel 200MHz 14-bit oscilloscope designed to measure high voltage, fast slew-rate signals such as those in a full or three-phase power electronic switching bridge. With new 300MHz 200x probes it can now handle 1600V signals to cope with the latest SiC MOSFETs.
Industry News | 2018-04-26 13:50:38.0
Model 765 is an advanced, modern solution for ultra-fast rise time complex pulse generation and synchronization with simple touchscreen control
Parts & Supplies | Chipshooters / Chip Mounters
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Parts & Supplies | Pick and Place/Feeders
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Technical Library | 2012-12-14 14:28:20.0
This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.
SMTnet Express, November 4, 2021, Subscribers: 26,512, Companies: 11,460, Users: 26,912 Fabrication Of Solderable Intense Pulsed Light Sintered Hybrid Copper For Flexible Conductive Electrodes Additively printed circuits provide
