Electronics Forum: ict hp3070 manuals (Page 1 of 3)

Equipment Heat Load

Electronics Forum | Tue Jul 03 05:49:24 EDT 2001 | armin

Hi, Anybody could give me the Heat Load of Heller 1800W, Heller 1088 and ICT Tester HP 3070. Read their manuals but could not find the above specs. I need them for our new manufacturing facility / building air conditioning requirement. thanks and r

QSTATS at HP3070 Series 3

Electronics Forum | Tue Sep 08 20:32:55 EDT 2009 | juanv

Hi, This is the firstime that I'm working with a HP 3070 Series 3 ICT. We ran the first assemblies and I would like to know where could I find all the information about this first article run. Fist of all, I need to know how could I visualize at

advice on selecting ATE/ICT

Electronics Forum | Fri Sep 21 11:48:26 EDT 2007 | chef

My past experience included flying probe- we used it as more an R&D tool, it obvious wasn't fast enough for production. Once the probe gave us the answers need, we then developed the HP 3070 test bed and program.

AOI vs. electrical test

Electronics Forum | Tue Jan 03 15:16:53 EST 2006 | Cmiller

In circuit testing is expensive up front because of the fixture cost but the tests are fast. AOI programs can be develpoed in less than a day but take longer to run. If you have good test coverage, in circuit would be a better choice in my opinion-if

Re: testing after SMt assembly

Electronics Forum | Wed Jul 21 10:11:57 EDT 1999 | Mark Quealy

| | Dear all | | Please help me to know what kind of tests usually done after SMT Pick & place and reflow oven. | | Our appliocation is Mainly fabrication of mother boards. | | Thanks | | | In theory, ICT is the classical answer (In-Circuit Test).

Re: testing after SMt assembly

Electronics Forum | Fri Jul 23 10:16:16 EDT 1999 | Boca

| | | Dear all | | | Please help me to know what kind of tests usually done after SMT Pick & place and reflow oven. | | | Our appliocation is Mainly fabrication of mother boards. | | | Thanks | | | | | In theory, ICT is the classical answer (In-Ci

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:52:57 EDT 2012 | rgduval

Reese, We would agree about the value of an ICT system, in a general manufacturing environment. However, a couple of notes apply: 1. ICT isn't a catch-all, either, and should be used to verify the process, not validate it. Quality should be buil

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:08:20 EDT 2012 | rgduval

An ICT solution seems to be overkill for what you've described. What kind of volumes are you hand building? How many components are not marked? What is your current yield with the process you are using? What is/was your yield prior to implementing m

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:58:24 EDT 2012 | rway

Reese, > > We would agree about the value of an > ICT system, in a general manufacturing > environment. However, a couple of notes > apply: > > 1. ICT isn't a catch-all, either, and > should be used to verify the process, not > validate it.

AOI Systems

Electronics Forum | Thu Feb 17 09:24:10 EST 2005 | Frank R.

In a few weeks I will receive an AOI machine. My concern is to know where is the best location for this machine in the complete assembly line. Here is a description of what I have : Auto loader - Printer - Chipshooter PNP - Multi fonctionnal PNP -

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