The phoenix microme|x is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection (µAXI). Innovative and unique features and an extreme high po
In-line X-ray and optical inspection for high-end electronics production. TRAILBLAZING X-RAY TECHNOLOGY AND ULTRA-MODERN XM CAMERA TECHNOLOGY IN ONE SYSTEM. The in-line X-ray system X7056-II is primarily distinguished by high throughput and first-c
Industry News | 2018-02-20 12:57:12.0
[December 29, 2017 – Taipei, Taiwan] Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, will join IPC APEX 2018 held at San Diego Convention Center on February 27th - March 1st featuring innovative one-stop inspection solution for Industry 4.0-based PCBA manufacturing. Visit booth #1317 to see TRI's all new 3D SPI, 3D AOI, 3D Planar CT AXI and ICT solutions in action and discuss your inspection requirements with TRI's experts.
Industry News | 2019-11-12 12:31:32.0
Expands Saki's Lineup of Compact, Lightweight, Ultra-High-Speed Inline 3D CT Automated X-ray Inspection Systems
Highly flexible, multi-axis inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is especially
SMTnet Express, May 21, 2015, Subscribers: 22,770, Members: Companies: 14,358, Users: 38,224 Reliability of Embedded Planar Capacitors under Temperature and Voltage Stress Mohammed A. Alam, Michael H. Azarian, Michael Osterman and Michael Pecht
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/last-will-of-bga-void.pdf
+ cycles Investigation Conclusion: Overall void density on BGA component was not high Solder crack path typically found at solder joint / BGA package interface 165 Planar (flat
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