New SMT Equipment: tr5001 (2)

TR5001T SII Tiny In-Circuit Tester

TR5001T SII Tiny In-Circuit Tester

New Equipment | Test Equipment - Bond Testers

TR5001T SII TINY is a new generation of TRI's Tiny In-Circuit Tester. Offering up to 640 testing points and extending coverage with Boundary Scan, the TR5001T SII TINY brings an extended ICT feature set in the industry's most compact and affordable s

TRI - Test Research, Inc. USA

TR5001 SII QDI Series In-Circuit Tester (ICT)

TR5001 SII QDI Series In-Circuit Tester (ICT)

New Equipment | Test Equipment - Bond Testers

Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel/Merged Core testing with up to 4 independent cores for high-throughput testing. TRI's most advanced manual handler features industry-approved hands-free safety desig

TRI - Test Research, Inc. USA

Used SMT Equipment: tr5001 (2)

Test Research (TRI) TR5001

Test Research (TRI) TR5001

Used SMT Equipment | In-Circuit Testers

• Modular upgrade options from MDA to ICT and functional test • High fault coverage test solution • Limited access solution and functional test expansion using PXI modules • Friendly UI with fast and easy program development.

SMTUNION

Test Research (TRI) TR5001E

Test Research (TRI) TR5001E

Used SMT Equipment | In-Circuit Testers

Fealures • Modular upgrade options from MDA to ICT and functional test • High fault coverage test solution • Limited access solution and functional test expansion using PXI modules • Friendly UI with fast and easy program development Tester Sp

SMTUNION

Industry News: tr5001 (10)

TRI won two EM Asia Innovation Awards for AOI and ICT

Industry News | 2020-07-09 18:35:55.0

Test Research, Inc. (TRI) announces that it was awarded two 2020 EM Asia Innovation Awards in two categories. The TR7700Q SII won the Test Equipment: AOI award. The TR5001 SII LED Series ICT was awarded Outstanding Product of the Year. The award ceremony was held during the 2020 Productronica China exhibition in Shanghai, China.

TRI - Test Research, Inc. USA

TRI Highlights Smart Factory Inspection Solutions at IPC APEX EXPO 2019

Industry News | 2019-01-06 21:27:59.0

[December 14, 2018 – San Jose, CA] Test Research, Inc. (TRI), the leading test and inspection solutions provider for the electronics manufacturing industry will join IPC APEX EXPO 2019 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the printed circuit board electronics manufacturing industry. Visit TRI at booth #2533 on January 29 – January 31, 2019 to discover the newest innovations in 3D SPI, 3D AOI, 3D CT AXI and multicore ICT.

TRI - Test Research, Inc. USA

Videos: tr5001 (1)

TR5001 SII QDI Series In-Circuit Tester (ICT)

Videos

Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel/Merged Core testing with up to 4 independent cores for high-throughput testing. TRI's most advanced manual handler features industry-approved hands-free safety desig

TRI - Test Research, Inc. USA


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