Industry News | 2020-12-01 17:14:52.0
Heralds Design-through-Manufacturing 4.0
Industry News | 2014-02-26 00:51:26.0
ADLINK Technology today announced its Matrix MXE-5301 fanless, embedded computer as the first hardware platform to be certified for the Intel® Industrial Solutions System Consolidation series.
Industry News | 2020-02-13 15:42:07.0
Industrial OEMs see value in optimizing the right flash technology to ensure host architecture compatibility while meeting application workload requirements
Industry News | 2018-09-04 05:34:10.0
The AMD Radeon™ Pro V340 graphics card is a dual-GPU solution based on the advanced AMD “Vega” architecture1, optimized to deliver extreme performance and high user density for virtualized environments. It is the first VDI hardware solution equipped with 32GB of ultra-fast, second-generation high-bandwidth memory, providing massive amounts of memory and bandwidth for today’s most complex design and media workloads.
Industry News | 2020-09-23 11:45:08.0
Amkor Technology invites you to join us at the FREE Electronic Design Process Symposium (EDPS) virtual event September 30-October 1, 2020. EDPS is the leading forum for advanced chip and systems design processes. Amkor's Gerard John, Sr. Director, FCBGA, will present "Using Machine Learning to Optimize Semiconductor Test" on October 1st at 5:50 PM PST.? Abstract: Machine learning (ML) is a field of engineering under the artificial intelligence (AI) umbrella, based on the idea that systems can learn from data, identify patterns and make decisions with minimal human intervention. ML is often used as a prediction tool to perform analysis on large amounts of data, automate analytical model building and provide the user (human, machine or calling function) with event occurrence probability. To date, the test community has not embraced ML and continues to look at ML with skepticism when approached with the paradigm shift - replacing conventional product test suites with a test suite selected by an ML algorithm. This skepticism may be the result of multiple factors, such as limited familiarity with ML, partial awareness of its capabilities, lack of tools that can be easily used and the workload involved in the process of training a machine to discern data. In addition, by running a compressed test suite suggested by ML, questions arise about test escapees and their potential impact on product quality. This talk uses the example of an Open-Short test to shed light on optimizing semiconductor test using ML. For more information and to register for this FREE event, visit the EDPS website
Industry News | 2012-02-22 01:36:35.0
ACD announces a new system for preparing projects for delivery to the manufacturing floor.
Industry News | 2013-11-17 19:10:28.0
Fuji has updated its offline power supply unit released in March to support AIMEX-2 and AIMEX-2S machines. The offline power supply unit reduces the load on operators and adds further automation to SMT production lines.
Industry News | 2019-01-06 21:32:31.0
Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry will join NEPCON Japan held at Tokyo Big Sight to showcase state-of-the-art Inspection Solution for Smart Factories. Visit booth #E17-4 to experience Smart Factory Inspection Solutions in action.
Industry News | 2002-01-22 07:30:29.0
Motorola offers manufacturers an additional tool to improve operating efficiency with the introduction of Manufacturing Balance at the APEX trade show this week in San Diego, California. This best-in-class production optimization tool, introduced by Motorola's Global Software Group, will determine the optimum build plan for an entire factory with unmatched speed and accuracy. Production is optimized by grouping similar products and then assigning them to the most capable lines in a manufacturing facility.
Industry News | 2013-09-09 17:00:56.0
ACD announces that it has expanded its team with the appointment of two new project coordinators to further strengthen its customer service.
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