Industry News | 2012-12-03 19:52:39.0
Printed Board Assembly Cleaning and Contamination Testing Center marks its debut at IPC APEX EXPO®, February 19–21, 2013, at the San Diego Convention Center.
Industry News | 2015-05-18 21:29:50.0
The SMTA Capital Chapter is pleased to announce its second meeting of 2015 on May 28th, scheduled from 5:30 pm to 8:00 pm at NTS Baltimore formerly Trace Labs, 5 North Park Drive, Hunt Valley, MD 21030. The focus of this chapter meeting will be “Failure Analysis Process for Printed Board Assemblies” presented by John M. Radman, Senior Applications Engineer, NTS Baltimore.
New Equipment | Assembly Services
Ion Chromatography (IC) and ROSE Cleanliness Testing
Technical Library | 2021-04-29 01:49:47.0
In this work, we highlight the fundamental differences between conventional IC (4 mm and 2 mm) and Capillary Ion Chromatography.
Technical Library | 2021-04-29 01:43:34.0
Since the 1980s the electronics industry has utilized ion chromatography (IC) analysis to understand the relationship of ions, and some organics, to product reliability. From component and board fabrication to complete electronic assemblies and their end-use environment, IC analysis has been the de facto method for evaluating ionic cleanliness of electronic hardware.
Technical Library | 2021-04-29 01:47:17.0
For the separation of ionic species, ion chromatography (IC), a type of liquid chromatography, is the method of choice. The most critical component of this technique is the separation column, which is selected based on factors that include the specific analytes of interest, the sample type and the required detection levels. This article outlines the column parameters that impact the separation of charged species in solution using ion-exchange chromatography and the developments that have continued to redefine what is possible with an IC system.
As the leader in precision cleaning, ZESTRON is uniquely positioned to offer you the analytical services and expertise needed to ensure you meet your precision cleaning requirements. Ionic contamination testing, SIR testing, ion chromatography, FTIR
New Equipment | Test Equipment
PROCESS SCIENCES, INC. (PSI) Visit our main Ion Chromatography page for more information. Ion Chromatography analysis (IC) is an essential tool for both failure analysis and process validation. PSI uses IC to investigate surface contamination and m
New Equipment | Test Equipment
Localized Electronics Cleanliness Tester and Residue Extractor The information gathered when using the C3 is intended to provide a measure of the cleanliness of a localized region of a circuit board. In addition, the C3 extracts a sample of the effl
Technical Library | 2023-12-26 17:50:54.0
In this white paper, we discuss the pros and cons of five analytical techniques when applied to residue analysis on electronic assemblies. We evaluate the following for their application and limitations for analyzing both visible and invisible residues: FITR, SEM/EDX, XRF, Ion Chromatography, and ROSE
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