Industry News: measurement software (Page 2 of 124)

MIRTEC to Exhibit Complete Line of Technologically Advanced 3D AOI and SPI Inspection Systems at IPC APEX 2016

Industry News | 2016-02-17 17:07:17.0

“The Global Leader in Inspection Technology,” will premier its complete line of 3D AOI and SPI Inspection Systems in Booth #1334 at the 2016 IPC APEX EXPO. The premier technical conference and exhibition for the electronics manufacturing industry will take place March 15-17, 2016 at the Las Vegas Convention Center.

MIRTEC Corp

Mirtec Co, LTD to Showcase Leading AOI Solutions at NEPCON China, Shanghai

Industry News | 2008-04-08 23:29:59.0

Seoul, Korea � April 2008 � MIRTEC Co, LTD, the leading global manufacturer of AOI and AXI inspection systems announces it will showcase their complete line of inspection solutions in booth 4F10 at the upcoming NEPCON China/EMT China 2008 exhibition and conference, scheduled to take place April 8-11, 2008 in Shanghai, PR China.

MIRTEC Corp

MIRTEC TO PREMIER ITS COMPLETE LINE OF TECHNOLOGICALLY ADVANCED AUTOMATED OPTICAL INSPECTION SYSTEMS AT APEX 2010

Industry News | 2010-03-24 12:21:18.0

MIRTEC, "The Global Leader in Inspection Technology", announced that it will premier its complete line of AOI and SPI systems at APEX 2010.

MIRTEC Corp

MIRTEC To Premier Its Complete Line of Technologically Advanced Automated Optical Systems at IPC Electronics Midwest 2010

Industry News | 2010-09-01 22:03:07.0

MIRTEC, "The Global Leader in Inspection Technology", announced that it will premier its complete line of inspection systems at in booth #7617 at the upcoming IPC Electronics Midwest Conference & Exhibition, scheduled to take place September 28-30, 2010 at the Donald E. Stevens Convention Center in Rosemont, IL.

MIRTEC Corp

Mirtec To Premier Its Complete Line of Technologically Advanced Automated Optical Inspection Systems at SMTAI 2010

Industry News | 2010-10-01 00:32:52.0

MIRTEC, “The Global Leader in Inspection Technology”, announced that it will premier its complete line of inspection systems at in booth #7326 at the upcoming SMTA International, scheduled to take place October 26-27, 2010 at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.

MIRTEC Corp

MIRTEC to Preview the MP-520 Advanced System in Package (SiP) Inspection and Measurement System at SEMICON West 2015

Industry News | 2015-06-11 16:02:18.0

MIRTEC, "The Global Leader in Inspection Technology," will exhibit its most recent solutions for System in Package (SiP) inspection and measurement at SEMICON WEST 2015; July 14-16, 2015, at the Moscone Center in San Francisco, CA. Visitors are invited to booth # 2343 for a detailed demonstration of this exciting new technology.

MIRTEC Corp

MIRTEC to Premier Its Technologically Advanced AOI Systems at IPC Midwest 2011

Industry News | 2011-08-22 18:45:28.0

MIRTEC, “The Global Leader in Inspection Technology” will premier its complete line of AOI systems in booth #100 at IPC Midwest 2011

MIRTEC Corp

MIRTEC To Premier Its Technologically Advanced Automated Optical Inspection Systems at SMTAI 2011

Industry News | 2011-09-19 16:37:06.0

MIRTEC, “The Global Leader in Inspection Technology,” announces that it will premier its complete line of AOI systems in Booth #124 at SMTA International 2011.

MIRTEC Corp

Digitaltest Announces New High-Speed Test Heads For MTS 500 Condor Flying Probe Test System

Industry News | 2003-06-19 08:13:11.0

The new heads are capable of reaching an acceleration of greater than 20g.

SMTnet

MIRTEC AND YXLON RECEIVE JOINT GLOBAL TECHNOLOGY AWARD FOR THE NEW SMARTLOOP YIELD IMPROVEMENT SYSTEM

Industry News | 2015-11-12 20:58:32.0

MIRTEC and YXLON jointly received a 2015 Global Technology Award in the category of Software – Production for the new SmartLoop yield improvement system. The award was presented to the companies during a ceremony on Tuesday, Nov. 10, 2015 that took place at the Messe München exhibition center in Munich, Germany during Productronica.

MIRTEC Corp


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