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optical control to display the OC SCAN CCX.3 Component Counter at NEPCON South China

Industry News | 2018-08-01 20:06:07.0

optical control today announced plans to exhibit at NEPCON South China, scheduled to take place Aug. 28-30, 2018 at the Shenzhen Convention & Exhibition Center. Company representatives will demonstrate the OC-SCAN®CCX.3 component counter in Stand 1C03 in cooperation with Suzhou Link Ways Tech Co., Ltd.

optical control GmbH & Co. KG

SEHO to Debut New Entry-Level Selective Soldering System at SMTAI

Industry News | 2018-09-18 20:04:12.0

SEHO Systems today announced plans to exhibit at SMTA International, scheduled to take place Oct. 16-17, 2018 in Rosemont, IL. The company will introduce the new StartSelective – the perfect plug-and-produce selective soldering system for those just entering into automated soldering.

SEHO Systems GmbH

SEHO’s Entry-Level Selective Soldering System in Booth #423 at SMTAI

Industry News | 2018-10-01 20:25:11.0

SEHO Systems today announced plans to exhibit at SMTA International, scheduled to take place Oct. 16-17, 2018 in Rosemont, IL. The company will introduce the new StartSelective – the perfect plug-and-produce selective soldering system for those just entering into automated soldering in Booth #423.

SEHO Systems GmbH

optical control to show component counter with automatic loading at electronica 2018

Industry News | 2018-10-29 17:35:54.0

optical control GmbH is pleased to announce plans to exhibit at electronica 2018, scheduled to take place Nov. 13-16, 2018 at the Messe Munchen in Munich, Germany. The company will demonstrate the OC-SCAN®CCX.3 component counter with automatic loading and offline station in the joint pavilion “Cluster Mechatronik & Automation Management GmbH,” Hall A2 Booth 337.

optical control GmbH & Co. KG

Optical Control to show component counter with automatic loading/unloading at APEX

Industry News | 2019-01-04 15:45:35.0

Optical Control Americas, is pleased to announce plans to exhibit at the 2019 IPC APEX EXPO, scheduled to take place Jan. 29-31, 2019 at the San Diego Convention Center in CA. The company will demonstrate the OC-SCAN®CCX.3 component counter with automatic loading/unloading and offline station in Booth #1932. Additionally, a major new software update will be launched at the show.

optical control GmbH & Co. KG

How to get the most from your visit to electronica 2008 in Munich

Industry News | 2008-09-14 14:27:36.0

Munich, Germany, September 14, 2008 - Messe M�nchen gathered the collective experiences of many previous electronica attendees and has published a white paper entitled, "How to get the most from your visit to electronica 2008 in Munich".

Messe München GmbH

Lattice MachXO2 PLD Family Sets New Standards for Low Cost, Low Power Designs

Industry News | 2010-11-08 22:24:13.0

Lattice Semiconductor Corporation (NASDAQ: LSCC) today unveiled its new MachXO2™ PLD family, which offers designers of low-density PLDs an unprecedented mix of low cost, low power and high system integration in a single device.

Lattice Semiconductor

The Best of Electronics Manufacturing: Automation System Integration to Be NEPCON China 2015 Highlight

Industry News | 2015-03-18 20:35:50.0

News reports claim that foreign companies are leaving China in numbers. So are major manufacturing operations, as evidenced by cases of Microsoft and Nokia, who both recently shut down their China plants. Uniqlo, Foxconn, Clarion and Samsung are also accelerating the transfer of their manufacturing activities to other countries. The made-in-China label is losing its au

Reed Exhibitions - RX (Reed Exhibitions)

Humidity and temperature

Electronics Forum | Wed Sep 14 04:09:21 EDT 2016 | jimmyh

We are enclosing our SMT room and will control the Humidity and Temperature of the room. Is there a standard for humidity and temperature for a SMT room and if so what is it. What is protocol if it goes out of tolerance? Do we stop production? Is

SPC for Wave solder (defects on PCB's)

Electronics Forum | Wed Feb 15 19:20:46 EST 2006 | Mr. Samir

Russ, On both instruments, I ran them through the wave 20 times each using identical profiles and wave parameters, and then used statistical formulas to measure the variation and repeatability of each. I had these all in Excel, but that was around 1


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