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TR7600F3D SII - 3D CT X-ray Inspection

TR7600F3D SII - 3D CT X-ray Inspection

New Equipment | Inspection

The TR7600F3D presents a next-generation inspection platform for the most demanding PCB design. The inline CT AXI solution combines ultra-high resolution imaging with high definition planar CT inspection, a new robust hardware platform, and a redesig

TRI - Test Research, Inc. USA

New High-Throughput AOI and AXI at productronica 2023

Industry News | 2023-09-25 18:09:37.0

Test Research, Inc. (TRI) will join productronica 2023, which will be held at Messe München Center from November 14 – 17, 2023. Visit booth No. A2-139 to experience TRI's newly released test and inspection solutions.

TRI - Test Research, Inc. USA

Experience the Future at TRI's Innovation Seminars

Industry News | 2024-01-29 11:16:46.0

Test Research, Inc. (TRI) will feature Innovative Inspection Solutions, SPI, AOI, AXI, and ICT solutions at a series of technology seminars and product demos held in Taiwan, Shenzhen, and Suzhou. Each of the one-day events will focus on the latest test and inspection technology innovations for SMT and Advanced Packaging production, including the Smart Factory and AI-powered Solutions.

TRI - Test Research, Inc. USA

AI-powered Inspection Solutions from TRI at SEMICON Taiwan 2021

Industry News | 2021-12-07 14:56:11.0

Test Research, Inc. (TRI) will join NEPCON Asia held at Taipei Nangang Exhibition Center, Hall 1 from December 28 – 30, 2021. Visit booth #I3116 to experience the latest in Smart Factory Semiconductor Inspection.

TRI - Test Research, Inc. USA

TRI Highlights Smart Factory Inspection Solutions at IPC APEX EXPO 2019

Industry News | 2019-01-06 21:27:59.0

[December 14, 2018 – San Jose, CA] Test Research, Inc. (TRI), the leading test and inspection solutions provider for the electronics manufacturing industry will join IPC APEX EXPO 2019 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the printed circuit board electronics manufacturing industry. Visit TRI at booth #2533 on January 29 – January 31, 2019 to discover the newest innovations in 3D SPI, 3D AOI, 3D CT AXI and multicore ICT.

TRI - Test Research, Inc. USA

TRI to Feature Innovative Inspection Solutions at NEPCON Japan 2020

Industry News | 2019-11-27 12:21:14.0

Test Research, Inc. (TRI) will join NEPCON Japan held at Tokyo Big Sight to showcase state-of-the-art Inspection Solution for Smart Factories. Visit booth #W1-42 to experience Smart Factory Inspection Solutions in action.

TRI - Test Research, Inc. USA

TRI to discuss LED Testing and AI at TestForum 2022

Industry News | 2022-11-15 12:58:22.0

Test Research, Inc. will take part in the 2022 Nordic Test Forum (NTF), held at the Scandic Ambassadeur in Drammen, Norway, from November 29 - 30, 2022.

TRI - Test Research, Inc. USA

TRI to showcase AI-powered Inspection Solutions at NEPCON China 2021

Industry News | 2021-03-30 11:50:25.0

Test Research, Inc. (TRI) will join NEPCON China held at Shanghai World Expo Exhibition & Convention Center from April21 – 23, 2021to feature Innovative SMT Inspection solutions for the Smart Factories. Visit booth #1J40to experience Smart Factory Inspection Solutions in action.

TRI - Test Research, Inc. USA

TRI AOI Solutions Certified by IPC

Industry News | 2021-10-14 14:10:52.0

Test Research, Inc. (TRI) has certified two AOI solutions IPC-CFX compliant.

TRI - Test Research, Inc. USA

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