New Equipment | Test Equipment
High Accuracy, In-Circuit Test and Functional Test with IEEE, PXI, Boundary Scan and Flash Programming capability for all NPI and Electronic Manufacturing environments, Visiontest, optional fixture capability The Latest Technology in Flying Probe T
Industry Directory | Manufacturer
A & F has been building test fixture applications for over 25 years including bareboard test fixtures, ICT fixtures and functional/mechanical bed of nails test fixtures.
Used SMT Equipment | In-Circuit Testers
SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene
Technical Library | 2010-09-02 13:13:03.0
As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi
Technical Library | 2019-05-09 05:40:52.0
When the anti static ic tube is produced, it is empty at both ends. Therefore, before and after the electronic components are loaded into the plastic tube, the IC hoses need to be blocked at both ends. Generally, there are plastic nails and rubber stoppers.
Career Center | Gaithersburg, Maryland USA | Engineering,Production
Test Engineer Design hardware and software solutions required to test data communications products in a low-medium volume, high-mix production test environment. Design and build test fixtures to support these solutions. Support Production Test d
Example of Digitaltest's MTS 500 Condor system on a pcb panel.
The Testability Director is a spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government's Testability Program for Electronic Systems and Equip
A modern alternative of the bed-of-nails system, CAMtek offers Flying Probe Test as a universal platform for a cost effective test solution. Dual Side Probing Optical (AOI) Test Open Pin Scan Parametric Test Power-Up Functional Test Capable
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest poss
