Industry News: phoenix and package and analyzer (Page 3 of 6)

This in-person event will bring together operations, maintenance, engineering, and technology leaders to connect and learn about the industry's latest innovations and solutions

Industry News | 2022-04-20 14:38:49.0

Rockwell Automation, Inc. announced today that registration is now open for ROKLive, a Rockwell Automation and Plex Systems event taking place June 13-16 in Orlando, Fla. Joining with newly acquired Plex's annual PowerPlex event, the in-person ROKLive experience will bring together operations, maintenance, engineering and technology leaders and innovators to explore how Rockwell Automation's enterprise-wide solutions are linking OT and IT like never before.

Rockwell Automation, Inc.

University of Maryland professor, renowned author and editor dr. Michael Pecht to address 2008 International Reliability Physics Symposium.

Industry News | 2008-04-22 20:28:50.0

The IEEE International Reliability Physics Symposium's (IRPS) 46th annual conference announces the keynote speaker of this year's event will be Dr. Michael Pecht, chair professor and the director of the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland.

Institute of Electrical and Electronics Engineers (IEEE)

Saki Corporation Exhibits 3D AOI and SPI Systems at SMT Hybrid Packaging

Industry News | 2015-04-21 17:10:49.0

Saki Corporation will demonstrate its BF-3Di automated optical inspection and BF-3Si automated solder paste inspection systems at SMT Hybrid Packaging, Nuremberg, Germany, May 5-7 2015, in Stand 7-331.

SAKI America

Nordson to Exhibit Full Range of Market Leading Test and Inspection Systems at SMT/Hybrid/Packaging 2016

Industry News | 2016-04-04 09:33:43.0

Nordson DAGE, MatriX Technologies and Nordson YESTECH, divisions of Nordson Corporation (NASDAQ: NDSN), will exhibit their range of market leading Test and Inspection systems in Hall 7A, Booth 329 at the forthcoming SMT/Hybrid/Packaging, scheduled to take place April 26-28, 2016 at the Messe in Nuremberg, Germany.

Nordson DAGE

DOCTAR Design Review Software Adds Printed Circuit Board (PCB) Test Point and Physical Component Change Analysis

Industry News | 2003-03-11 21:51:18.0

New release compares netlists to identify test points moved, added, deleted, renamed or re-assigned in Excel and HTML reports.

cadalist-enterprises

Indium Corporation's Technology Experts to Present at IPC Conference on Solder and Reliability

Industry News | 2013-11-08 17:55:20.0

Several Indium Corporation technology experts will present at the inaugural IPC Conference on Solder and Reliability November 13-14 in Costa Mesa, California.

Indium Corporation

Data I/O and Matthew Associates to Feature Industry Leading FlashPAK III and ProLine RoadRunner at SMTA Nutmeg Expo & Tech Forum

Industry News | 2010-11-15 22:12:10.0

Data I/O Corporation and Matthew Associates will showcase the FlashPak III and ProLINE-RoadRunner™ systems at the upcoming SMTA Nutmeg Expo & Tech Forum

Data I/O Corporation

New Pressurex Zero� Sensor Film Measures and Maps Very Low Contact Pressures

Industry News | 2008-11-06 10:05:03.0

Pressure-Indicating Sensor Film Useful in PCB Lamination and other Applications

Sensor Products Inc.

Intel and VJ Technologies to Present Pad Site Dress Methods at SMTAI 2010

Industry News | 2010-09-27 23:15:26.0

VJ Technologies, Inc., the leader in rework technologies and global provider of advanced X-ray inspection systems, announces that Intel’s James Wade and Raiyo Aspandiar, along with VJ Technologies’ Donald Naugler and Terry Leahy will present a paper titled “PCB Pad Site Dress Methods on BGA and Socket Pad Arrays” at the upcoming SMTA International, scheduled to take place October 24 - 28, 2010 at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.

VJ Electronix

Akrometrix LLC Will Discuss Thermal Warpage and Strain Metrology at APEX

Industry News | 2016-02-17 16:31:00.0

Akrometrix LLC will exhibit in Booth #1623 at the 2016 IPC APEX EXPO, scheduled to take place March 15-17, 2016 at the Las Vegas Convention Center. Company representatives will discuss Akrometric’s TherMoire’ AXP modular metrology platform that provides shadow moire’, digital fringe projection and digital image correlation capabilities in one platform. Akrometrix also will demonstrate its new Real-Time Analysis Software along with Array Generation Software (for thermal warpage measurement and partitioning of wafers) and Interface Analysis Software that allows high level and in-depth review of the attachment interface between two surfaces that warp during microelectronics and electronic assembly production reflow processes.

Akrometrix


phoenix and package and analyzer searches for Companies, Equipment, Machines, Suppliers & Information