Electronics Forum | Fri Jul 15 03:29:52 EDT 2005 | dougs
thomas, why isn't it process control, you cant just think that because you've set up your machine properly ( pot temp, wave height, pre-heat etc etc )that everything is going to be ok, there are other factors that you wont find with wave riders or
Electronics Forum | Fri Jul 15 12:41:56 EDT 2005 | russ
You are not wrong in monitoring the Product (your really not monitoring the process). This methodology is valuable if your process is unstable (SPC is used to stabilize process). There is value in "real time" inspection of a process's product as lon
Electronics Forum | Mon Jul 18 18:36:01 EDT 2005 | slthomas
"thomas, why isn't it process control," Minute detail, really. Defects aren't a measurement of process parameters, they're the result of them (and a few other things that have been mentioned). SPC measures process parameters. It is preemptive, and
Electronics Forum | Sat Feb 01 04:49:59 EST 2003 | testing
Hi, We currently have several AOIs on our production/test line which I feel as an engineer, are not being used to their true potential. Does anyone have any ideas on how I can improve their use i.e SPC, Placement in the production line etc since we
Electronics Forum | Thu Jul 14 16:32:06 EDT 2005 | jdengler
I guess DB's not commenting on the money. Jerry
Electronics Forum | Tue Jul 19 04:27:29 EDT 2005 | Rob
http://www.crimelibrary.com/criminal_mind/scams/DB_Cooper/ Now I understand!
Electronics Forum | Thu Jul 14 10:41:27 EDT 2005 | slthomas
I guess I took too much time editing my response. :P The bottom line is that unless you're measurements are at least as repeatable and accurate as your machine's closed loop systems, it's a waste of paper *BUT* makes nice wall art for tours. I like
Electronics Forum | Thu Jul 14 11:04:53 EDT 2005 | dougs
yes SPC can be used on a wave solder machine, you should use a c-chart to monitor the amount of defects per board or group of boards, this will let you know if your process is stable, as you improve your process you should re-calculate your UCL, hope
Electronics Forum | Thu Jul 14 11:52:16 EDT 2005 | davef
Sure you can use SPC charting on the wave setup parameters to warn of impending problems. Examples of useful points of analysis are: * Dwell * Temperature * Pot analysis Certainly there's a range of other process controls that could be monitored.
Electronics Forum | Fri Jul 15 10:56:19 EDT 2005 | pr
As Russ said, you do a DOE beforehand. BUT Maybe we are missing something, we do SPC after the wave (1/5) to catch defect trends and fix them with a minimum of inspection. If you are running a 2,000 piece pull, are you that confident that your origin
