Used SMT Equipment | In-Circuit Testers
1 - VP Card 1 - Prism Card 1 - Deltascan Card 3 - VP Extender Cards 40 - CC2 Cards 2 - DUT Power Supplies 1 - Shorting Plate 1 - PC (includes keyboard, mouse and display) 1 - Strip Printer
Used SMT Equipment | In-Circuit Testers
Manufacturer: Teradyne Make: SPECTRUM 8800 Series Model: 8851 Configuration: 1 – PC “Windows” Controller (with keyboard, mouse and display) 1 – PRISM 1 – VP2 9 – CC2 Cards 1 – Programmable DUT Supply Controller 1 – 5.5v/24v/24v Powe
Used SMT Equipment | In-Circuit Testers
Teradyne Spectrum 8852 In Circuit Tester For Sale The tester is configured as follows: Front Cage FIB-0 / MX1 VP Prism (8) CC2-DIG-128ch FIB-1 / TEK Rear Cage (1) CC2-DIG-128ch VP-EXT MXI Note: Tektronix VX4101A (VXI MultiPaq Inst
Used SMT Equipment | In-Circuit Testers
Teradyne Spectrum8862SE vintage2007 for sale 19*CC2A 1*CC3 1*Prism card 1*VP card 1*HP DC7600 Controller
Used SMT Equipment | In-Circuit Testers
Teradyne TSSE ICT System 16 x CC2A Channel card 4 x CC3 card Deltascan card Prism card VP2 card HP DC7600 PC Controller 电话：+86-0512-62990639 http://www.kingtestasset.com
New Equipment | Test Equipment
Limited access testing using IEEE1149.1 standard is now an essential part of manufacturing test strategy for complex and high node count digital boards. Teradyne SPECTRUM series of In-Circuit testers provide Boundary Scan capabilities. The SPECTRUM d
Used SMT Equipment | In-Circuit Testers
Fully refurbished Spectrum 8852 PC,Celeron(R), 2.8GHz 256Mb Ram, 40Gb Hdd, CdRom, Fdd, USB, Serial, Parallel ports Win Xp Pro SP3 Teradyne D1.1 software PCI-MXI-2 IO card (NI 7771185-01), p/n 090-310-00, fitted in PC Cable PCI-IO to System
Used SMT Equipment | In-Circuit Testers
Teradyne 8852 fully refurbished. Configuration: Wired for 2560 Test Points 10 x CC2 Cards P/N (048-830-00) 1280 Test Points 1 x High Voltage Prism (051-004-00) Rev W.O 1 x VXI-VP2 32Mb (051-116-01) Rev G 1 x Mini Fib (051-059-00) Rev E 1 x D
New Equipment | Test Equipment
Teradyne’s Spectrum™ 8862 (TSSE) is a unique combinational in-circuit (ICT)/ functional test system that can lower overall costs and test times for manufacturers that prefer to combine functional and ICT test capabilities on a single system. Spectrum
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