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SMTnet Express, January 2, 2020, Subscribers: 33,306, Companies: 10,954, Users: 25,467 Temperature Cycling and Fatigue in Electronics Credits: DfR Solutions The majority of electronic failures occur due to thermally induced stresses and strains
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SMTnet Express, July 2, 2020, Subscribers: 28,589, Companies: 11,034, Users: 25,930 A PROCEDURE TO DETERMINE HEAD-IN-PILLOW DEFECT AND ANALYSIS OF CONTRIBUTING FACTORS Credits: Cookson Electronics Head-in-Pillow (HIP) defects are a growing concern
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