Electronics Forum | Fri Jun 05 15:06:26 EDT 1998 | Dave F
| I have just been assigned to look into the ionic chromotograhy test on our PCBA but I have zero knowledge. Could anyone help to explain what is this test about? Is it | a) a destructive test? | b) What is the measurement unit of this test? | c) Wh
Electronics Forum | Fri Jun 05 10:24:56 EDT 1998 | Earl Moon
| I have just been assigned to look into the ionic chromotograhy test on our PCBA but I have zero knowledge. Could anyone help to explain what is this test about? Is it | a) a destructive test? | b) What is the measurement unit of this test? | c) Wh
Electronics Forum | Mon Nov 01 19:50:29 EST 2004 | davef
Q1: Will the ion chromatography be able to identify and quantify the contaminant? A1: Yes, it will identify and quantify the amount of contaminant. Obviously this is very useful in troubleshooting the source of the contaminant. [The only problem fo
Electronics Forum | Fri Feb 20 08:56:42 EST 2004 | davef
We successfully clean WS flux on 1mm and 1.25mm pitch BGA. For 0.8mm pitch BGA, we use no clean, because we cannot remove the flux residue from under them efficiently. Use ion chromatography testing to be sure it is clean under the BGA. IC is the on
Electronics Forum | Fri Mar 26 12:26:31 EST 2004 | Mike Konrad
Hi Patrick, With all due respect, it is easy to quantify zero. You made a claim that your flux produces ZERO residue. There are several industry-standards (IPC and Military) of determining the cleanliness of post-reflowed circuit assemblies. Th
Electronics Forum | Wed Jun 30 18:12:59 EDT 2004 | crios
Thanks for the information. davef, I will search for and review the Ion Chromatography for Ionic Cleanliness test method. This definitely is the test I want to perform. Do you know what the IPC specification is using this test method? The outside
Electronics Forum | Mon Mar 21 09:33:25 EST 2005 | davef
RoHS Substance||RoHS MCV Limits||Typical Testing Approaches Lead||1000 ppm* ||Wet chemical digestion followed by ICP (Inductively coupled plasma) or AAS (atomic absorption) spectroscopy ||||XRF (X-ray fluorescence) spectroscopy Cadmium||100 ppm ||Wet
Electronics Forum | Fri Apr 15 14:06:24 EDT 2005 | saragorcos
Shean made some good points and offered some good starting resources. Adding to what he said, I would also mention that many times, even a no-clean flux can cause contamination that requires cleaning. Our lab has dealt with numerous cases of client
Electronics Forum | Fri Jan 06 09:15:34 EST 2006 | sarar
I would suggest that it would be helpful to perform ion chromatography analysis on some of the boards that have failed your ionograph tests as well as some boards that have passed. This will tell you exactly what ionic species are present on the boa
Electronics Forum | Thu Oct 05 16:04:00 EDT 2006 | GS
I am not expert, just my comment, the total ionic contamination allowed after SMT, by using No Clean process, theoretically it should be close to Zero. Any way the Standard IPC-JSTD-001 allows 1,56 ugr NaCl/cm2 for the final Printed Board assembled.
