New Equipment | Cleaning Agents
MICRONOX MX2302 is an engineered semi-aqueous solvent blend designed to remove difficult flux and paste residues from wafer bumps found in die-attach, flip chip, copper pillar, and emerging semiconductor assemblies. MX2302 is used as received in all
New Equipment | Cleaning Agents
IONOX® I3955 is a precision vapor cleaning solvent designed as a drop in replacement for modern era vapor degreasing equipment. IONOX® I3955 is effective in removing no clean and rosin flux residues from electronic assemblies including low stand-off
New Equipment | Cleaning Equipment
PSE LX9 Super large economy system for assembled PCBs, hybrids, misprints The kolb PSE economy line is a quality series of advanced cleaning systems, which focuses on all essential criteria for a qualified cleaning process and therefore st
New Equipment | Cleaning Equipment
PSE LH5 Fully automatic economy batch cleaner for assembled PCBs The kolb PSE economy line is a quality series of advanced cleaning systems, which focuses on all essential criteria for a qualified cleaning process and therefore stands for
New Equipment | Cleaning Agents
IONOX FCR is a high-strength, concentrated cleaner containing a blend of organic solvents and inhibitors. FCR is engineered to remove organic acid, rosin and no-clean flux residues from electronic assemblies, advanced packages, hybrid and SMT substra
Industry News | 2013-01-18 14:26:23.0
Aqueous Technologies today announced that it will participate in the Printed Board Assembly Cleaning and Contamination Testing Center during the upcoming IPC APEX EXPO
Technical Library | 2023-04-17 21:17:59.0
The purpose of this paper is to evaluate and compare the effectiveness and sensitivity of different cleanliness verification tests for post soldered printed circuit board assemblies (PCBAs) to provide an understanding of current industry practice for ionic contamination detection limits. Design/methodology/approach – PCBAs were subjected to different flux residue cleaning dwell times and cleanliness levels were verified with resistivity of solvent extract, critical cleanliness control (C3) test, and ion chromatography analyses to provide results capable of differentiating different sensitivity levels for each test. Findings – This study provides an understanding of current industry practice for ionic contamination detection using verification tests with different detection sensitivity levels. Some of the available cleanliness monitoring systems, particularly at critical areas of circuitry that are prone to product failure and residue entrapment, may have been overlooked. Research limitations/implications – Only Sn/Pb, clean type flux residue was evaluated. Thus, the current study was not an all encompassing project that is representative of other chemistry-based flux residues. Practical implications – The paper provides a reference that can be used to determine the most suitable and effective verification test for the detection of ionic contamination on PCBAs. Originality/value – Flux residue-related problems have long existed in the industry. The findings presented in this paper give a basic understanding to PCBA manufacturers when they are trying to choose the most suitable and effective verification test for the detection of ionic contamination on their products. Hence, the negative impact of flux residue on the respective product's long-term reliability and performance can be minimized and monitored effectively.
New Equipment | Test Equipment
For over 40 years the Benchmark for Ionic Contamination Testing Commonly referred to "Cleanliness Testing" as this test method has, for over 40 years, been acknowledged as an important Quality Assurance and Process Control tool in the manufacture of
Industry News | 2013-03-25 14:54:55.0
Aqueous Technologies, will present a cleaning and reliability workshop to address emerging trends in electronic assembly that have a significant impact on precision cleaning.
Industry News | 2013-05-22 09:35:40.0
Aqueous Technologies,will present a cleaning and reliability workshop on Thursday, June 13, 2013 at SpringHill Suites Dallas Richardson-Plano in Texas.
