Used SMT Equipment | In-Circuit Testers
FSM-60S Fusion Splicer Kit (with cleaver) - The FSM60S fusion splicer sets the standard for core alignment fusion splicing by incorporating a user-friendly interface with enhanced features to provide the most rugged and reliable fusion splicer in the
Used SMT Equipment | In-Circuit Testers
Fujikura FSM-60S FSM-60S Fusion Splicer Kit (with cleaver) - The FSM60S fusion splicer sets the standard for core alignment fusion splicing by incorporating a user-friendly interface with enhanced features to provide the most rugged and reliable
Used SMT Equipment | In-Circuit Testers
Storage Battery Systems SBS-EX Battery Diagnostic TesterThe SBS-EX is a cost-effective version of our SBS-ULTRA . It meets all IEEE and NERC battery testing standards and accurately measures the internal resistance (mOhm), conductance (Seimens), volt
Used SMT Equipment | General Purpose Test & Measurement
Fujikura FSM-60S FSM-60S Fusion Splicer Kit (with cleaver) - The FSM60S fusion splicer sets the standard for core alignment fusion splicing by incorporating a user-friendly interface with enhanced features to provide the most rugged and reliable
Used SMT Equipment | General Purpose Test & Measurement
Fluke 43B Power Quality Analyzer The Fluke 43 Power Quality Analyzer performs the measurements you need to maintain power systems, troubleshoot power problems and diagnose equipment failures. All in a rugged handheld package. Combines the
Used SMT Equipment | In-Circuit Testers
Fluke 43B Fluke 43B Power Quality Analyzer The Fluke 43 Power Quality Analyzer performs the measurements you need to maintain power systems, troubleshoot power problems and diagnose equipment failures. All in a rugged handheld package. Co
Used SMT Equipment | In-Circuit Testers
Differential Probe 3.5Ghz Tektronix proven expertise in probes brings you the highest fidelity in high-speed differential probing. The P7330 and P6330 high-bandwidth differential probes offer excellent signal fidelity, meeting the needs of engineer
Used SMT Equipment | In-Circuit Testers
Tektronix P6246 Active Probe 400MHz The P6248, P6247 and P6246 enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in disk drive, digital IC design (RAMBUS) and communication applications (G
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 4145A The 4145A Semiconductor Parameter Analyzer performs high speed DC characterization of semiconductor devices and materials automatically, saving you time and money. It has four programmable stimulus/measurement units capable
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight 4145A The 4145A Semiconductor Parameter Analyzer performs high speed DC characterization of semiconductor devices and materials automatically, saving you time and money. It has four programmable stimulus/measurement units capable