Used SMT Equipment | In-Circuit Testers
Aeroflex IFR ATC-1200Y3 Transponder/DME Test Set The ATC-1200Y3 Test Set contains a built-in crystal-controlled signal generator, attenuator and modulators. It is intended to work in combination with a dual trace oscilloscope to give a absolute
Used SMT Equipment | In-Circuit Testers
Transponder/DME Test Set The ATC-1200Y3 Test Set contains a built-in crystal-controlled signal generator, attenuator and modulators. It is intended to work in combination with a dual trace oscilloscope to give a absolute bench test of the necessary
 ATC CLOSE SENSOR 40002127.jpg)
KE2050(2060) ATC CLOSE SENSOR Model:40002127
Parts & Supplies | Other Equipment
1.Short leadtime; 2.Quality guaranteed; 3.all size and model available. Through years of efforts,we've developed a wide range of SMT nozzle for various machines including but not limited to FUJI, JUKI, KME, PANASERT, SAMSUNG, SANYO, S
Used SMT Equipment | Pick and Place/Feeders
Excellent Turnkey Condition For Under $30, Make Best Offer. 2006 Topaz XII In Excellent Turnkey Condition, Latest Software Revision for model, (8) Mixed Head w/ FNC and ATC Heads for Faster more Flexible Placement. Also, (75) SMT Feeders, all units
Industry Directory | Consultant / Service Provider / Manufacturer
We provide extensive embedded hardware and software for ARM based microcontroller, such as development board, emulator,etc.
Used SMT Equipment | Pick and Place/Feeders
2006 Dual Gantry Assembleon (Philips Yamaha) Topaz X2 w/ FNC, ATC, Lastest Revision of Software, Manuals, (50) SMT Feeders, ETC., We also have a video of it before being removed from line in .mpg format. Also, the ability to skid/Skeleton Crate unit
Used SMT Equipment | Chipshooters / Chip Mounters
2006 Assembleon (Yamaha/Philips) Topaz XII in Excellent Turn Key Condition, There are a lot out threre but if you are looking This Is Worth Looking At. Comes with Latest Revision of Software, Dual Head with FNC/ATC Heads for Speed placement. Dual L
Technical Library | 2021-09-08 14:10:12.0
The Pb-Free Alloy Characterization Program sponsored by International Electronics Manufacturing Initiative (iNEMI) is conducting an extensive investigation using accelerated temperature cycling (ATC) to evaluate ball grid array (BGA) thermal fatigue performance of 12 commercial or developmental Sn based Pb-free solder alloys. This paper presents the initial findings from a specific subset of the temperature cycling test matrix. The focus is on comparing alloy performance for two of the most commonly specified temperature cycles, 0 to 100 °C and -40 to 125 °C.
Industry News | 2011-05-06 20:47:45.0
Multitest announces that the MT9510 now provides extended temperature control with its extended temperature calibration (XTC).
