Electronics Forum | Thu Mar 06 18:48:34 EST 2003 | msivigny
Hello George, SPC can be time consuming but if you don't track or make recordings consistently then how do you measure your process performance and overall line quality?I'm sure your customer is asking because they want you to demonstrate that your p
Electronics Forum | Tue May 02 12:13:07 EDT 2000 | Sal
Guys, We are currently on the market for an SPC tool for our reflow & wavesoldering equipment. In order to please customers we require a tool to measure the repeatibility of our of both the above mentioned processes and collate this information ( SP
Electronics Forum | Thu Sep 09 08:33:07 EDT 1999 | Dave F
| My company is looking to perform "real time" statistical process control on our current SMT operations. I have identified the critical processes for SPC but have not had much luck in finding a system(s) that can monitor the required processes for m
Electronics Forum | Tue Jan 12 17:56:18 EST 1999 | Jason Hall
| For process management with SPC of the stencil printing process with a fully automatic stencil printer, what process outpur parameter would you recommend for SPC? | | It appears to me that there are two options: | A: to have a pn chart based upon
Electronics Forum | Tue Feb 07 11:26:40 EST 2006 | Cal Kolokoy
At the wave, you should collect data on the critical process parameters. The cliche being, it's better to control your process via SPC versus performing SPC on defect data. Perform a DoE to determine which variable interactions have the greatest eff
Electronics Forum | Wed Oct 25 12:38:05 EDT 2000 | Phil
Hi there!! You know what your QA is doing is right, coz by measuring the solder paste height can avoid the following defects: 1.Insufficient solder 2.Short solder or bridging 3.Solder balls SPC monitoring for paste height checking is required
Electronics Forum | Fri Jan 26 08:28:59 EST 2001 | Sal
I am currently in the Process of setting up some SPC software on our Wavesoldering equipment. What I would like to know for each Parameter that is listed below what kind of variation from my average setpoint would cause defects.Example. If the averag
Electronics Forum | Mon Jan 29 04:27:47 EST 2001 | wbu
Hi Sal, taking the dwell time as parameter to control seems to me unessary. Dwell time is a function of other settings that can be controlled (adjusted) more easily (conveyor speed, wavehight-settings, angle). Although dwell time is essential it�s I
Electronics Forum | Tue Apr 17 08:54:09 EDT 2001 | davef
Process capability indices are pretty well documented. Consider: 1 A good general SPC book like: Statistical Quality Control; EL Grant & RS Leavenworth; Mcgraw-Hill; ISBN 0078443547 2 Other good books are: Statistical Process Control For SMT; WS
Electronics Forum | Wed Sep 08 16:00:09 EDT 1999 | Mark D.
My company is looking to perform "real time" statistical process control on our current SMT operations. I have identified the critical processes for SPC but have not had much luck in finding a system(s) that can monitor the required processes for my
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