Electronics Forum: test pad (Page 9 of 62)

No Clean OSP process cause ICT testing issue due to Flux building in testvia hole

Electronics Forum | Fri Mar 29 07:53:12 EDT 2019 | davef

Why are you printing paste on test via? In the old days, we probed soldered pads to cushion impact force of probing. Is that still a reasonable practice?

Probe Mark during ICT

Electronics Forum | Mon Jun 04 23:52:57 EDT 2012 | rway

Actually, if you experience lack of witness marks, you probably have a problem. Witness marks are OK and will not affect your assembly. I assume this is an SMT assembly we are talking about, in which case, this is what your test pads are for. You

Dull Gold effects on solderability quality

Electronics Forum | Fri Jun 24 09:32:53 EDT 2011 | kahrpr

Looking at the appearance of pads and solder joint is pretty subjective. Especially lead free people are all over the map on the physical appearance of pads and joints. The true test is solderabilty testing, weather it’s just looking for good wetti

Battery Nickel strips soldering in HASL PCB finish

Electronics Forum | Mon Nov 26 13:40:40 EST 2018 | robl

Hi Prem, Yes, the flux in the Cobar paste helped with wetting and joint strength, as does reducing voids as there is more solder in the joint, as does cooling rate. Regarding peel test in KG, it depends on the pad size and volume of solder in the j

Re: Wetting Balance Equipment

Electronics Forum | Mon Aug 17 02:57:47 EDT 1998 | Bob Willis

| | Looking for Suppliers of surface mount wetting balance equipment. | Bucky: Section 6 of the ANSI/J-STD-002 specification lists wetting balance suppliers. Dave F I like and continue to use the Multicore system. I have had many ours using the sys

Black Pad

Electronics Forum | Tue Jan 10 20:56:45 EST 2006 | davef

Implementing a Simple Corrosion Test Method to Detect "Black Pad" Phenomenon in Electroless Nickel/Immersion Gold Plating ; BabHui Lee; Circuitree 11/1/03 http://www.circuitree.com/CDA/Archives/34f2b343900f7010VgnVCM100000f932a8c0

Black PAD

Electronics Forum | Wed Jun 14 20:49:32 EDT 2006 | davef

We too do not use ENIG. Too expensive and risky. Implementing a Simple Corrosion Test Method to Detect "Black Pad" Phenomenon in Electroless Nickel/Immersion Gold Plating ; BabHui Lee; Circuitree 11/1/03 http://www.circuitree.com/CDA/Archives/34f2b

in-line testing

Electronics Forum | Fri Jul 08 12:35:44 EDT 2005 | esoderberg

Last year we installed two in-line ICT/Functional testers. With the current volume getting ever greater, we need to be able to identify post test what has been tested and what has not. One idea was to put two circular pads 0.100 apart with an 0.004"

Pull Test

Electronics Forum | Wed Aug 15 12:59:26 EDT 2001 | upinder

Hi All. I am looking for a typical Pull Test Results for the adherence of 0402 / 0603 components to the pads. Thanks USingh

Re: Passive component shear Testing

Electronics Forum | Tue May 23 20:39:37 EDT 2000 | Dave F

Scott: Sounds like fun: � Solder joint strength in pull/shear varies with lead geometry, solder volume, lead metal/metallization, and the test method. � Among things, IPC-TM-650 talks to getting pads off-of boards. For instance: Method 2.4.8 is for


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