Used SMT Equipment | In-Circuit Testers
Tektronix DPO4032 Bandwidth: 350.0 MHz Channels: 2 The DPO4032 is part of the newest addition to the Tektronix Digital Phosphor Oscilloscopes family, the DPO4000 Series. It is a 350 MHz, 2.5 GS/s, 10 M record length, 2 channel digital phosphor os
Used SMT Equipment | In-Circuit Testers
The E6621A PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated unit and extends Agilent’s unmatched portfolio of LTE test solution
Used SMT Equipment | In-Circuit Testers
400,000 Wfms/ second Maximum Waveform Capture Rate Optional Communications Mask Testing Up to 2 .5 Gb/ s Rates Optional Clock Recovery from Serial Data Streams Optional 32-bit Serial Trigger for Isolation of Pattern dependent Effects
Used SMT Equipment | In-Circuit Testers
Agilent N4416A Balanced Measurement S-parameter Test Set, 300 kHz to 6 GHz The Agilent N4416A S-parameter test set is a key component of an Agilent physical layer and balanced-measurement system. When combined with an Agilent PNA Series E8356A,
Used SMT Equipment | In-Circuit Testers
Agilent N4416A Balanced Measurement S-parameter Test Set, 300 kHz to 6 GHz The Agilent N4416A S-parameter test set is a key component of an Agilent physical layer and balanced-measurement system. When combined with an Agilent PNA Series E8356A,
Used SMT Equipment | In-Circuit Testers
90 dB) enables the S251C to accurately measure antenna-to-antenna isolation in the presence of high RF activity. Data Analysis Software enables assessment of system trends, problems and performance in addition to professional report generation. An op
Used SMT Equipment | In-Circuit Testers
90 dB) enables the S251C to accurately measure antenna-to-antenna isolation in the presence of high RF activity. Data Analysis Software enables assessment of system trends, problems and performance in addition to professional report generation. An op
Used SMT Equipment | In-Circuit Testers
400,000 Wfms/ second Maximum Waveform Capture Rate Optional Communications Mask Testing Up to 2 .5 Gb/ s Rates Optional Clock Recovery from Serial Data Streams Optional 32-bit Serial Trigger for Isolation of Pattern dependent Effects
Used SMT Equipment | In-Circuit Testers
Agilent N4416A Balanced Measurement S-parameter Test Set, 300 kHz to 6 GHz The Agilent N4416A S-parameter test set is a key component of an Agilent physical layer and balanced-measurement system. When combined with an Agilent PNA Series E8356A,
Used SMT Equipment | In-Circuit Testers
Rohde & Schwarz DVM400 MPEG-2 test system The R&S DVM family consists of four base units and one expansion unit, all of which have extremely compact designs. All four base units can be configured in accordance with customer requirements and exp
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