Defect Detection for Advanced Wafer and Package Devices
Category |
||||||||||||||||||||||
Date: |
Fri, September 18, 2020 |
|||||||||||||||||||||
Admission: |
free |
|||||||||||||||||||||
Description: |
The SMTA Capital Chapter is excited to host a FREE webinar Friday, September 18th on “Defect Detection for Advanced Wafer and Package level devices using Scanning Acoustic Microscopy.” The webinar will be given by James C.P. McKeon, Ph.D, Director of Technology at Sonix, Inc. |
|||||||||||||||||||||
Url: |
||||||||||||||||||||||
More events from Surface Mount Technology Association (SMTA) |
||||||||||||||||||||||
|
||||||||||||||||||||||
»
