JT 5745/RMI Mixed-Signal JTAG Tester

JT 5745/RMI Mixed-Signal JTAG Tester Description:

The JT 5745/RMI offers high performance JTAG TAP controller (tester) interfaces  plus digital and analog I/O in compact 1U by 19" rackmount package.

Measure power supplies, clock frequencies or test DACs and ADCs. Add you own capability through use of CoreCommander FPGA our generic bridge/translator system.

The JT 5745/RMI  (pictured right) feature 4 TAPs, 256 analog and digital I/O channels and making it ideal for production test of complex mixed-signal designs. Maximum TCK speed is 15 MHz and  all voltage levels are fully programmable.

• 4 JTAG TAPs
• Up to 256 MIOS Channels
• Measures Frequency
• Up to 32 Analog IO
• USB controller interface

Applications:

• Testing and programming of medium to high complexity mixed signal designs,
• Integration into functional ATE test-sets.

Benefits:

• High-performance JTAG TAP controller
• Supports analog and digital I/O channels 
• Front panel output for all test signals
• User configurable features via embedded FPGA
• Compact 1U 19"chassis

Specifications:

• Four 1149.x compliant Test Access Ports 
• TCK up to 15 MHz
• 256 I/O channels
• 8 Analog Input or Output channels (taken from 64 above)
• Analog accuracy ± (0.7% + 24mV)
• Analog range + 32.768V or ± 16.384V
• Frequency measurements to 128 MHz