JT 5745/RMI Mixed-Signal JTAG Tester
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JT 5745/RMI Mixed-Signal JTAG Tester |
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JT 5745/RMI Mixed-Signal JTAG Tester Description:
The JT 5745/RMI offers high performance JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact 1U by 19" rackmount package.
Measure power supplies, clock frequencies or test DACs and ADCs. Add you own capability through use of CoreCommander FPGA our generic bridge/translator system.
The JT 5745/RMI (pictured right) feature 4 TAPs, 256 analog and digital I/O channels and making it ideal for production test of complex mixed-signal designs. Maximum TCK speed is 15 MHz and all voltage levels are fully programmable.
- 4 JTAG TAPs
- Up to 256 MIOS Channels
- Measures Frequency
- Up to 32 Analog IO
- USB controller interface
Applications:
- Testing and programming of medium to high complexity mixed signal designs,
- Integration into functional ATE test-sets.
Benefits:
- High-performance JTAG TAP controller
- Supports analog and digital I/O channels
- Front panel output for all test signals
- User configurable features via embedded FPGA
- Compact 1U 19"chassis
Specifications:
- Four 1149.x compliant Test Access Ports
- TCK up to 15 MHz
- 256 I/O channels
- 8 Analog Input or Output channels (taken from 64 above)
- Analog accuracy ± (0.7% + 24mV)
- Analog range + 32.768V or ± 16.384V
- Frequency measurements to 128 MHz
JT 5745/RMI Mixed-Signal JTAG Tester was added in Jul 2015
JT 5745/RMI Mixed-Signal JTAG Tester has been viewed 558 times
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