High Accuracy Flying Probe System, Large Board Size, New Head Design, Low Maintainance, High Fault Coverage and Digitizer 2.0.
The Condor MTS 505 is Digitaltest's latest and most advanced flying probe system. Providing reliable, easy-to-use flexibility, functionali...
|
Test Equipment |
Because all of Digitaltest's systems provide a non-multiplexed(1:1) archetecture, and digital driver/sensors that support 10V and low voltage logic, migration can be a simple operation. Details of each solution can be found at www.digitaltest.net.
Standard translators Include:
|
Test Equipment |
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability.
HIGHEST THROUGHPUT AND HIGHEST QUALITY TEST
Full In-Line Integration
Compatible with Lambda Parallel Testing Solutions. Non-Multiplex...
|
Test Equipment |
The Lambda Software Option is Availible on the MTS 30 and MTS 300 test Systems.
Dependant on configuration the Lambda systems allow for tests of 2, 4 or 6 boards in parallel.
The Lambda Edition test...
|
Test Equipment |
High Pin Count, High Performance Tester, Non-multiplexed pin structure, In-Circuit Test, On-Board Programming, IEEE, PXI, Boundary Scan.
With the continuous and fast pace of development in the electronic manufacturing the time from design to production is a critical factor for suc...
|
Test Equipment |
Press-Down-Unit (PDU) Fixturing system provides lowest cost interface.
Combining Economics & Quality in PCB Test
Non-Multiplexed to 3,456 pins
One Touch Fixture Interface provides fastest change-over times (1,400 nets)
Fas...
|
Test Equipment |
Non-Multiplexed (1:1) In-Circuit (ICT), fuctional and hybrid test system with IEEE, PXI, Boundary Scan and Flash Programming.
The smallest system of the tester family is the MTS30, which is available in a portable 19” rack format.
The complete test system offers the po...
|
Test Equipment |
High Accuracy, In-Circuit Test and Functional Test with IEEE, PXI, Boundary Scan and Flash Programming capability for all NPI and Electronic Manufacturing environments, Visiontest, optional fixture capability
The Latest Technology in Flying Probe Test
...
|
Test Equipment |
Non-multiplexed In-Circuit Test, Functional Test, Boundary Scan and Flash Programming Capability.
Highest Throughput and Highest Quality Test
Non-Multiplexed to 3,456 pins
Fast Test Program Generation
Safe Back-Driving
10V and Low V...
|
Test Equipment |