A.T.E. Solutions, Inc.

The leading Test, ATE and Testability consulting and educational firm, offering various test related courses. Maintains the BestTest Directory, a test community knowledge base. Publishes The BestTest eNewsletter.

Repair/Rework, Test Services, Service Provider, Training Provider

A.T.E. Solutions, Inc. is the one stop solution for your test, ATE and testability problems. Through its renoun test-related courses, publications and test community web site, the company collects and disseminates test knowledge. For more specific problems, expert consultants can provide consulting services in various aspects of test, including, Test Requirements Analysis, Test Strategy and Management, Building an ATE, Design for Testability Analysis and Recommendations, Built-In Self Test, Failure Mode and Effects Analysis, and many other test-related consulting. The company also develops and teaches courses for test vendors. A.T.E. Solutions, Inc., through its wide network in the industry can assist you with test programming, test services and production testing.

A.T.E. Solutions, Inc. Postings

3 products »


A.T.E. Solutions, Inc. is a world leader in electronics test consulting. We consult directly in many facets of test planning and testability topics. We have been providing solutions for test problems to both commercial and military clients for more t...

Test Services


The Testability Director

The Testability Director is a spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government's Testability Program for Electronic Systems and Equip...

The Testability Director

Test Related Courses

Test, ATE and Design for Testability Courses and Educational Resources A.T.E. Solutions, Inc. is the world's leading education firm in the field of test technology. We offer a great variety of courses and educational resources in a number of s...

Test Related Courses

2 technical articles »

Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test

Jun 20, 2018 | Louis Y. Ungar

Manufacturers test to ensure that the product is built correctly. Shorts, opens, wrong or incorrectly inserted components, even catastrophically faulty components need to be flagged, found and repaired. When all such faults are removed, however, functional faults may still exist at normal operating speed, or even at lower speeds. Functional board test (FBT) is still required, a process that still relies on test engineers’ understanding of circuit functionality and manually developed test procedures. While functional automatic test equipment (ATE) has been reduced considerably in price, FBT test costs have not been arrested. In fact, FBT is a huge undertaking that can take several weeks or months of test engineering development, unacceptably stretching time to market. The alternative, of selling products that have not undergone comprehensive FBT is equally, if not more, intolerable....

Causes and Costs of No Fault Found Events

Apr 14, 2016 | Louis Y. Ungar

A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.

This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner....

3 news releases »

Test Economics Course in Silicon Valley

Jan 07, 2010 | A 1-day Intensive Seminar on March 11, 2010

New Testability Group To Bring DFT to Management

Dec 05, 2007 | December 10, 2007 at 9 AM in San Jose

Cost Effective Test Covered in One Day Course

Mar 09, 2007 | ATE, DfT and BIST combined with Test Economics

Benchtop Fluid Dispenser

Fast PCB Assembly