S300 Probe Station

S300 Probe Station Description:

Best-in-the-world measurements for 300mm wafers

The Cascade Microtech S300 probe station sets the measurement standard for 300mm on-wafer test. Whether your application is device characterization and modeling, wafer-level reliability, design de-bug or IC failure analysis, the S300 probe station has the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.

With state-of-the-art integrated measurement technologies, the Cascade Microtech S300 probe station allows engineers to create the perfect on-wafer measurement environment to assure best-in-the-world measurements.

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