The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro mobility applications, the telecommunications market and the automotive sector force the manufacturers to think beyond the concepts of a traditional standard probe in order to meet the demands of today�s highly complex test applications.
In this paper, we like to demonstrate probing concepts for three different scenarios: (1) High speed probing for fast data rate applications, (2) high current probing for multi-probe-environments and finally (3) pneumatic probing for sequential probing applications and fixtureless installations.
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