New SMT Equipment: component and induced and bow (3)

Henkel CSP and BGA Underfills

Henkel CSP and BGA Underfills

New Equipment | Materials

Henkel offers innovative capillary flow underfill encapsulants for flip-chip, CSP and BGA devices. These are highly flowable, high purity, onecomponent encapsulants. They form a uniform and void-free underfill layer to improve reliability performance

Henkel Electronic Materials

TherMoiré® AXP - Thermal Warpage and Strain Measurement Tool

TherMoiré® AXP - Thermal Warpage and Strain Measurement Tool

New Equipment | Test Equipment

3D Deformation Measurement with Akrometrix TherMoiré and Digital Fringe Projection. Akrometrix' patented TherMoiré systems are the industry leading tools for advanced characterization of temperature-dependent warpage. First introduced in 1998 for us

Akrometrix

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Electronics Forum: component and induced and bow (4)

PCB assembly bow and twist

Electronics Forum | Thu Dec 26 12:12:55 EST 2013 | igorfo

Dear Friends, I need your help to understand requirements and measurement methods for bow and twist of assembled PCB (PCBA have and SMT and TH components). I already check all posts on the site but didn't found any related to my question answers.

Re: Bow and Twist of PCB's

Electronics Forum | Wed Aug 19 08:00:55 EDT 1998 | Earl Moon

| Hi there, | I'm actually facing a lot of trouble with PCB's presenting up to 3mm of bow /twist at reception i.e. before assembly. The PCB size is 220 by 230mm. The boards are to be assembeled SMD double sides with 05.mm pitch on both sides. In orde

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Industry News: component and induced and bow (14)

Nordson ASYMTEK and Nordson MARCH to Present Papers at Contamination, Cleaning, and Coating Conference in Amsterdam

Industry News | 2017-05-10 18:15:53.0

Nordson ASYMTEK and Nordson MARCH, Nordson companies (NASDAQ: NDSN), will present papers at the Conformal Coating Materials and Processes session at the Contamination, Cleaning, and Coating Conference being held in Amsterdam, Netherlands. Transitioning from Manual to Automated Conformal Coating, by Michael Szuch, Nordson ASYMTEK and Optimizing the Plasma Treatment Process Prior to Conformal Coating to Eliminate ESD Induced Failures, by David Foote, Nordson MARCH, will be presented on Wednesday, May 24, 2017.

ASYMTEK Products | Nordson Electronics Solutions

IPC and JEDEC Help Industry Transition to Lead Free Associations Host Conference on Transitioning to Lead Free � Strategies for Implementation

Industry News | 2009-02-21 17:56:00.0

BANNOCKBURN, Ill. and ARLINGTON, Va., USA, February 19, 2009 � IPC � Meeting the requirements of RoHS (restriction of the use of certain hazardous substances in electrical and electronic equipment) compliance and successfully implementing lead-free electronics assembly processes is an ongoing challenge for the electronic interconnect industry. To help companies work toward their compliance goals, IPC and JEDEC present �Transitioning to Lead Free � Strategies for Implementation,� a three-day conference to be held March 3�5, 2009 in Santa Clara, Calif.

Association Connecting Electronics Industries (IPC)

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Technical Library: component and induced and bow (1)

Whisker Formation Induced by Component and Assembly Ionic Contamination

Technical Library | 2023-02-13 18:56:42.0

This paper describes the results of an intensive whisker formation study on Pb-free assemblies with different levels of cleanliness. Thirteen types of as-received surface-mount and pin-through-hole components were cleaned and intentionally contaminated with solutions containing chloride, sulfate, bromide, and nitrate. Then the parts were assembled on double-sided boards that were also cleaned or intentionally contaminated with three fluxes having different halide contents. The assemblies were subjected to high-temperature/high-humidity testing (85_C/85% RH). Periodic examination found that contamination triggered whisker formation on both exposed tin and solder fillets. Whisker occurrence and parameters depending on the type and level of contamination are discussed. Cross-sections were used to assess the metallurgical aspects of whisker formation and the microstructural changes occurring during corrosion.

Celestica Corporation

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Events Calendar: component and induced and bow (1)

NEPCON Thailand - Assembly, Measurement and Testing Technologies for Electronics Manufacturing Expo

Events Calendar | Wed Jun 19 00:00:00 EDT 2019 - Sat Jun 22 00:00:00 EDT 2019 | Bangkok, Thailand

NEPCON Thailand - Assembly, Measurement and Testing Technologies for Electronics Manufacturing Expo

Reed Exhibitions

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Express Newsletter: component and induced and bow (733)


component and induced and bow searches for Companies, Equipment, Machines, Suppliers & Information

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Software programs for SMT placement and AOI Inspection machines from CAD or Gerber.