Electronics Forum | Thu Dec 16 15:06:32 EST 2010 | rway
I would go with AOI. Reasons are: --AOIs are faster --They have more coverage. Given, you cannot test the value of components, but the AOI will ensure that all resistors are correct, orientation of ICs are proper and components are present on the
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Industry News | 2010-03-24 13:02:29.0
March 2010 — atg Luther & Maelzer GmbH, in cooperation with Everett Charles Technologies, announces that it will highlight its A5-8 Head High-Speed Flying prober in parent company Everett Charles Technologies booth #1782 at the upcoming IPC/APEX conference and exhibition.
Industry News | 2010-10-22 11:14:13.0
Acculogic, Inc. introduces the new single-sided low-cost version of its successful Flying Scorpion FLS900-series. The FLS940Sxi Flying Prober delivers the short programming times and high fault coverage of traditional bed-of-nails in-circuit test for prototype, ramp-up and low-volume/high-mix test applications.
Technical Library | 2010-05-24 23:47:35.0
Die echte Integration zwischen ATE Flying Prober und Boundary Scan Tester, vorgestellt von Seica, kombiniert das Beste von beiden Testtechniken und multipliziert die Vorteile für den Anwender.
