Industry Directory | Distributor
Distributor of hot-sales and hard-to-find electronic and electromechanical components and supplies. Online catalogue, data sheets and purchasing. win-source.net
Industry Directory | Manufacturer
Golden State is a contract manufacturer that makes wire harnesses, electromechanical assemblies (box builds, subassemblies, PCBAs, kits, etc.) and services (sorting, rework, value additive manufacturing engineering)
ProntoTEST-FIXTURE used by electronics manufacturers will accurately setup your Automatic Test Equipment (ATE), Flying Probe and design your "bed of nails" test fixturing. In minutes Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Ma
A1S-33B A1S-35B A1S-35BE A1S-38B A1S-38BE A1S-52B A1S52B-S1 A1S-58B-S1 A1S-61P A1S61PEU A1S-61PN A1S-62DA A1S-62P A1S-62PN A1S-62RD3 A1S-63ADA A1S-63P A1S-64AD A1S64TCTTS1 A1S-65B-S1 A1S-68AD A1S-68B-S1 A1S68DA1 A1S-68DAI A1S-68DAV A1SC01B A1S-C03B A
Electronics Forum | Wed Apr 17 14:03:37 EDT 2002 | lysik
Pansonic is Real good about support once you have registered a machine. But They are in serious violation of the law if you have a part number and want to buy a part. In the USA a OEM must sell you parts no questions asked as long as you have a part
Electronics Forum | Fri Apr 19 12:27:09 EDT 2002 | jeffreybrown
I have read with interest this string of opinions about support of old machines. I am the service manager of Contact Systems and I deal with customer support every day. Our policy is to treat all owners of Contact machines in an evenhanded way. The w
Used SMT Equipment | Pick and Place/Feeders
OS: Windows XP Cycle Count: CTR1 45245085 CTR2 2848934 Includes Parts Tray Feeder Notes: The system will not power up. PTF motor elevator damage Main Unit damage Power supply 5V,12V Damages Serial: 10143531 Fea
Used SMT Equipment | Pick and Place/Feeders
Includes Parts Tray Feeder OS: Windows XP SW: 8.3.0.10 Cameras: Front ULC magellan firewire 1394 .94 mil per pixel. Rear ULC firewire 2.3 per pixel. Pecs: pec beam1 firewire 1394 .66 mil per pixel. pec beam 2 firewire 1394 .
Industry News | 2003-05-06 09:05:12.0
New Schematic Capture and Simulation Software Delivers Innovative Features and the Industry�s Best Price/Performance
Industry News | 2003-04-21 09:53:12.0
Michael T. O'Neill and Peter J. Simone
Parts & Supplies | SMT Equipment
Ya main parts Part Name:COVER KUCT ASSY PART No:KV7-M221A-A0X Part Name:GUIDE (YV导轨滑块) (LWL9), YV100-2 PART No:K46-M9174-10X Part Name:YV100 SENSOR,1-3 DZ-7232-PN1 PART No:KM0-M655F-10X Part Name:YVL88 吸咀杆 PART No:KG7-M7173-A0X Part N
Parts & Supplies | SMT Equipment
Universal Instruments UIC FH/FJ Spindle
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
www.unisoft-cim.com/pcbtest.htm - In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD & BOM files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is used by Test
many feeders in stock for univeral instrument . Part No.:50381216 please contact us if you want to know more .http://www.hitachi-feeder.com Tina@smtfeeders.cn
Training Courses | | | ESD Control Training Courses
Browse training and certification programs for electrostatic discharge (ESD) control in electronics assembly.
Events Calendar | Thu Oct 10 00:00:00 EDT 2019 - Sat Oct 12 00:00:00 EDT 2019 | Saigon, Vietnam
Electronics Assembly - International Expo For Electronic Parts and Components Manufacturing
Events Calendar | Wed Sep 11 00:00:00 EDT 2019 - Fri Sep 13 00:00:00 EDT 2019 | Ho Chi Minh City, Vietnam
NEPCON Vietnam - SMT, Testing Technologies Expo
Career Center | Detroit Metro area, Michigan USA | Engineering,Maintenance,Production,Technical Support
Technicians from entry level to senior level pro's. Prefer experience with one or more of the following OEM Equipment brands. Universal Instruments Speedprint Europlacer SMT (of Germany) Reflow Ovens Sanyo Panasonic DEK
Career Center | Fremont, California USA | Engineering
Troubleshoot and repair to component level a variety of digital and analog circuits Provide rework, assembly and testing instruction in support manufacturer(s) Rework various surface mount components in digital and analog circuits Perform
Career Center | , | Engineering,Maintenance,Management,Production,Technical Support
Having 10+years of Experience in manufacturing (SMT),Field Engineer Globally For Universal SMT Equipment .
Career Center | kishan, India | Engineering,Maintenance,Production,Quality Control,Research and Development
1 year experience as a sales executive,and quality team Leader
Heller Industries Inc. | https://hellerindustries.com/parts/2506k-2/
2506K - FUSE 20A - USE P/N 5578K for KOREA/CHINA BUILT OVEN Phone 1-973-377-6800 Company About News Events New Equipment Convection Reflow Ovens Reflow Oven MK7 -New
| https://www.feedersupplier.com/sale-14219938-universal-ai-bottom-guide-44896901-ai-spare-parts-for-universal-instruments.html
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