Acculogic introduces StatManager™ - an advanced test program coverage report generator with boundary scan fault inject capability. StatManager can calculate part and pin level coverage of Teradyne Spectrum and Teradyne Z18xx test programs. StatMana
Electronics Forum | Mon Mar 29 12:10:14 EDT 2010 | rway
Test Jet will work for catching lifted leads, certainly. X-ray is the only thing for testing for internal solder defects such as voids and cracks. I personally do not have any experience using X-ray, so I cannot advise on its reliability. Perhaps
Electronics Forum | Wed May 23 19:07:40 EDT 2001 | davef
These installation procedues will get you started http://www.teradyne.com/prods/tcs/products/hpi/vhdm/techbull.html
Used SMT Equipment | In-Circuit Testers
1 - PC 1 - MTG 1 - HSC 1 - CST 1 - DS Reference 1 - ICA w/HV 28 - Combo 2 1 - AFTM 1 - DSM 1 - Fixed Supply 6 - Alliance Power Supplies
Industry News | 2003-03-12 09:10:10.0
As part of the opening celebration, Teradyne will be exhibiting this week at SEMICON China and in April at Nepcon Shanghai.
Industry News | 2014-08-07 18:05:48.0
The SMTA Capital Chapter is pleased to invite you to its upcoming Capital Expo and Tech Form at Johns Hopkins Applied Physics Lab, 11100 Johns Hopkins Road, Laurel, MD 20723, on September 9, 2014, from 9:30 am until 3:00 pm.
Technical Library | 2012-12-14 14:17:56.0
This article provides practical and affordable Design-for- Test (DFT) and Design-for-Inspection (DFI) methods that will have a positive impact on product costs, yield, reliability, and time-to-market. The properties of testability (including controllability and observability) will be analysed as they relate to analogue and digital design rules and their cause/effect, as well as the electrical and physical characteristics of proper PCB design.
Technical Library | 2013-08-07 21:52:15.0
PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen...
Career Center | Oakville, Ontario Canada | Engineering,Management,Production,Quality Control,Research and Development
Individuals who excel in this position enjoy working on the hardware-software boundary, are driven by complex problem solving in a fast paced environment. Candidate should be familiar with most of the electronic technologies and be able to work wit
1st Place Machinery Inc. | http://www.firstplacemachinery.com/firstplace_teradyne_ict.html
Teradyne ICT Teradyne In-Circuit Tester Equipment Description Teradnye Model Number: Z1803 Plus-1 Serial Number: 1888-1-123 (20) 051-027-00 DR2 (11) 051-085-00 (1) 047-081-01 Deltascan2
| https://unisoft-cim.com/cad-to-cad.php
. For example Unisoft can import virtually any CAD file format and export to Teradyne/Genrad D2B Alchemist or Fabmaster Test Expert software
