Manufacturer of a new awarded and patented invention, the ParrotTM clip and probe for voltmeters, multimeters, oscilloscopes and other test and measurement equipment
Industry Directory | Equipment Dealer / Broker / Auctions
BRL Test is a full service electronic test equipment dealer. Low prices on premium quality equipment is what we are about. Our world class repair lab is what sets us apart. http://www.brltest.com/
New Equipment | Test Equipment
The Marconi 2955B combines all the measurement facilities required for testing mobile radio transceivers in the range up to 1000 MHz. This unit was also marketed as an IFR 2955B. The 2955B is a compact self-contained unit designed for bench or mobile
New Equipment | Test Equipment
The Marconi 2955B combines all the measurement facilities required for testing mobile radio transceivers in the range up to 1000 MHz. This unit was also marketed as an IFR 2955B. The 2955B is a compact self-contained unit designed for bench or mobile
Electronics Forum | Fri Jun 20 09:20:04 EDT 2008 | ampearl
I need a technical specialist to turn-on, trouble-shoot, modify, repair, and test the power supply prototypes at the printed circuit assembly and instrument levels. This person would be involved in setting up both manual and automated tests, making m
Electronics Forum | Thu Mar 01 23:15:28 EST 2007 | jmelson
You shouldn't be worrying about "impedance" on a DC relay. Just measure the resistance with a Voltmeter/Ohmmeter. If you need to know the current draw, it will be 24/resistance The impedance of an AC relay changes as the armature moves from the "off
Used SMT Equipment | General Purpose Test & Measurement
Signal Generator Minimum Frequency 100 kHz Signal Generator Maximum Frequency 1991 MHz Signal Generator Modulation AM,FM,Pulse Signal Generator Resolution 1 Hz Spectrum Analyzer Minimum Frequency 100 kHz Spectrum Analyzer Ma
Used SMT Equipment | In-Circuit Testers
Motorola R2600CHS Communication Analyzer with OCXO High Stability Timebase The Motorola R2600C Communication System Analyzer is designed specifically for the service and monitoring of radio communications equipment. The R2600C represents a brea
Industry News | 2016-10-05 04:52:28.0
ABI’s SYSTEM 8 MIS4, along with the Ultimate software, is a faster and more economical solution than using traditional oscilloscope, metering and other bench test instruments, and can quickly produce the required Pass/Fail or other test and debug results.
Industry News | 2018-04-03 13:24:54.0
This new scope series available from Saelig has 10.1” touchscreen, huge memory, built-in instruments to make a powerful yet affordable debug and development tool
Parts & Supplies | General Purpose Test & Measurement
Description: The TOS5050A are designed exclusively for hipot testing of electronic equipment and components conforming to various safety standards. The model TOS5050A is the type having with 5kV output in AC only. Complies with various safety s
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
Rohde & Schwarz CMU200 Loaded with Options THIS UNIT INCLUDES OPTIONS: B12,B21,B54,B56,B68,B96,U99.U65,K16,K17,K20,K21,K22,K23,K24,K29,K42,K43,K47,K48,K53,K57,K58,K59,K61,K62,K63,K64,K65,K66,K67,K68 Rohde & Schwarz CMU200 Universal Radio Commun
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• Strong experience with the installation, training, and repair on a variety of electro-mechanical, pneumatic, PLC, or computer controlled systems. • Strong Knowledge in SMT equipment, Screen Printer, AOI/SPI, Conformal Coat Systems, Reflow oven, X-R
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1st Place Machinery Inc. | http://www.firstplacemachinery.com/firstplace_credence_tester.html
Muxed Voltmeter, PN: 60-1016-20, QTY: 1 Relay Driver Muxed, PN: 60-1019-20, QTY: 2 HVVI Quad Microammeter, PN 60-1058, QTY: 2 Med Power Matrix Force, PN: 671-4217-00, , QTY: 3