New SMT Equipment: warpage calculate (4)

VP5200-V High-Speed In-Line 3D SPI

VP5200-V High-Speed In-Line 3D SPI

New Equipment | Inspection

70 percent of SMT manufacturing defects are caused during the solder paste printing process. Detection of these printing defects can greatly increase the overall quality of finished products and decrease the human hours associated with post-process r

Omron Inspection Systems

VT-S500 Advanced, High-Speed AOI

VT-S500 Advanced, High-Speed AOI

New Equipment | Inspection

Economical Solution to Advanced, High-Speed AOI The VT-S500 is Omron's solution to providing next-generation, 3D inspection capability at minimal cost. With revolutionary 3D image processing, the VT-S500 accurately analyzes the topographical feature

Omron Inspection Systems

Electronics Forum: warpage calculate (12)

warpage for 152mm length PCB

Electronics Forum | Thu Aug 09 01:05:03 EDT 2012 | sajith09

I would like to understand What will be the allowable warpage for 152mm length PCB. We are observing about 1.5mm warpage. Is that acceptable? Could you please share method to calculate the warpage

warpage for 152mm length PCB

Electronics Forum | Thu Aug 09 07:53:16 EDT 2012 | davef

Allowable bow & twist: Together, both IPC-A-600G and IPC-6012B represent the core IPC documents for describing the acceptable and nonconforming conditions that are either externally or internally visible on finished printed boards. IPC-A-600G relies

Industry News: warpage calculate (4)

ViTrox Technologies to Debut Next-Generation AOI Solution at the IPC APEX EXPO

Industry News | 2014-02-20 10:36:06.0

ViTrox Technologies will debut the new V510 Optimus 3D AOI system in booth #717 at the IPC APEX EXPO, scheduled to take place March 25-27, 2014 at the Mandalay Bay Resort & Convention Center in Las Vegas, Nevada.

ViTrox Technologies

SEHO PowerSelective: New Software Feature Ensures Highest Process Reliability

Industry News | 2011-11-03 21:37:32.0

SEHO Systems introduces a new software function for its best-selling selective soldering system - the PowerSelective. The new function ensures even higher process reliability by compensating product or production-related warpage of the assemblies to be processed.

SEHO Systems GmbH

Technical Library: warpage calculate (1)

Optimizing Flip Chip Substrate Layout for Assembly

Technical Library | 2007-11-29 17:20:31.0

Programs have been developed to predict the expected yield of flip chip assemblies, based on substrate design and the statistics of actual manufactured boards, as well as placement machine accuracy, variations in bump sizes, and possible substrate warpage. These predictions and the trends they reveal can be used to direct changes in design so that defect levels will fall below the acceptable limits. Shapes of joints are calculated analytically, or when this is not possible, numerically by means of a public domain program called Surface Evolver. The method is illustrated with an example involving the substrate for a flip chip BGA.

Universal Instruments Corporation

Videos: warpage calculate (1)

ORPRO Vision SPI Presentation

ORPRO Vision SPI Presentation

Videos

ORPRO Vision SPI Presentation. This presentation introduces the methods and technology used by ORPRO Vision in the Symbion P36 Plus SPI system. For additional information, please contact ORPRO Vision at sales.us@orprovision.com sales.eu@orprovision

Orpro Vision GmbH

Express Newsletter: warpage calculate (93)

SMTnet Express - July 6, 2017

SMTnet Express, July 6, 2017, Subscribers: 30,558, Companies: 10,626, Users: 23,470 Effects of Package Warpage on Head-in-Pillow Defect Zhenyu Zhao, Chuan Chen, Yuming Wang, Lei Liu, Guisheng Zou, Jian Cai and Qian Wang - Tsinghua University

SMTnet Express - October 3, 2019

SMTnet Express, October 3, 2019, Subscribers: 32,260, Companies: 10,890, Users: 25,178 Effects of Temperature Uniformity on Package Warpage Credits: Akrometrix Knowing how package warpage changes over temperature is a critical variable in order


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