Accurate 16 channel temperature profiling system for use in reflow soldering and wave solder process verification. The equipment offers class leading price,dimensions and performance, RF telemetry and ease of use.For full details visit the 'PROfile
New Equipment | Wave Soldering
Maximizes Yields and Reduces Rework The ECD Fluxometer® maximizes yields and reduces rework by qualifying your spray fluxer pattern uniformity and top-side-penetration. Improve Process Quality - Eliminate guesswork when it comes to managing the c
Extremely reliable, proven inspection for wave, reflow, pre-reflow and selective soldering. The S3088 flex AOI system was developed for reliable, economical defect detection and fast process optimization. From prototypes to large volume, this flexib
Reliable optical inspection of wave, reflow, pre-reflow and selective soldering. More than an entry into AOI Optimal, ergonomic loading through large opening angle Superior resolution, reliable 01005 and fine-pitch inspection Scalable camera t
Solder joint inspection of bottom-side PCBs Intelligent Inspection of Solder Joints, THT and SMD Components Today, the industry standard quality assurance in electronics production is automatic optical inspection (AOI) of SMD components on printed
Time and temperature are very important variables in soldering printed circuit boards. It is important to bring the circuit board assemblies up to a high enough temperature for a long enough period to effectively solder the components to the board. G
New Equipment | Test Equipment
Anritsu S820C Microwave Site Master, 3.3 GHz to 20 GHz, Built in DTF The Anritsu S820C spectrum analyzer is a wide band, very sensitive receiver. It works on the principle of "super-heterodyne receiver" to convert higher frequencies (normally rangi
The long-term inspection solution for wave, reflow, pre-reflow and selective soldering. In the manufacturing of electronic assemblies, optimization of the production processes is a major factor in the success of producing to the high demands of qual
| 1 |
