| http://etasmt.com:9060/te_news_industry/2021-09-15/26564.chtml
lot of time This is where the waste mostly occurred because of trial and error Low yield is always expected on the first batches of sample Concept of NPI Solutions
| http://etasmt.com/te_news_industry/2021-09-15/26564.chtml
lot of time This is where the waste mostly occurred because of trial and error Low yield is always expected on the first batches of sample Concept of NPI Solutions
| https://productronica.com/en/trade-fair/press/press-releases/detail/assured-quality-and-tangible-economic-benefits.html
: Even without AI, two thirds of the tested assemblies could be identified as good parts. Of the around 30% not in the first pass yield, only the smallest portion actually had an error
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