Technical Library: labs for mlcc (Page 1 of 1)

The Use of an Available Color Sensor for Burn-In of LED Products

Technical Library | 2015-06-18 12:42:57.0

In the recent past, the Light Emitting Diode (LED) was hailed as the new energy efficient light source that would never have to be replaced. There were claims of 50,000+ hrs lifetime for the humble LED. That story has changed over the last few years as the number and diversity of the LED based products has increased. This is not to say that the original evidence was incorrect, but the initial enthusiastic estimates from the labs did not match the ultimate test, customers. As a result of poor quality products affecting the overall opinion of LED based products, it is critical that manufacturers can be confident in the quality of their product. In current times we want to have products certified, checked and ensure that we have the best quality. For the purposes of this paper we will look at one aspect of LED product, and this is the Lumen maintenance and estimated lifetime. The method described here does not seek to replace using high quality rating labs, but hopefully will allow the manufacturer to know with confidence that their prototype product, upon going to certification labs will be of a high enough quality that no expensive re-designs are required.

Feasa Enterprises Limited

Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages

Technical Library | 2013-01-31 18:43:15.0

There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis; prevention and prediction of interconnect defects and has been employed in failure analysis labs and production sites worldwide. First published in the 2012 IPC APEX EXPO technical conference proceedings

ZN Technologies

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