Technical Library: solid state (Page 1 of 1)

The Future of Solid-State Electronics

Technical Library | 1999-05-06 13:44:43.0

This paper explores the direction in which IC technology is headed, highlights potential roadblocks and possible solutions, and discusses some of the physical considerations that could determine the ultimate limits of integration.

Alcatel-Lucent

Economical Aluminum Substrates Make Light Work of Visible LED Circuits

Technical Library | 2009-04-09 17:29:48.0

Advances in solid state light emitting diodes (LEDs) over the last several years have opened new applications for these devices. Traditionally used only in low power, low light output applications, modern high power LEDs are finding their way into a wide variety of applications. LEDs for lighting applications offer several advantages over traditional incandescent lighting methods

IRC, Inc - Advanced Film Division of TT electronics, plc

Cree® XLamp® LED Thermal Management

Technical Library | 2009-06-11 18:28:24.0

XLamp LEDs lead the solid-state lighting industry in brightness while providing a reflow-solderable design that is optimized for ease of use and thermal management. Lighting applications featuring XLamp LEDs maximize light output and increase design flexibility, while minimizing environmental impact. This application note serves as a guide to understanding thermal management of XLamp LEDs and minimizing the effects of elevated junction temperatures.

Cree, Inc.

Microelectronics Reliability: Physics-of-Failure Based Modeling and Lifetime Evaluation

Technical Library | 2024-04-22 20:16:01.0

The solid-state electronics industry faces relentless pressure to improve performance, increase functionality, decrease costs, and reduce design and development time. As a result, device feature sizes are now in the nanometer scale range and design life cycles have decreased to fewer than five years. Until recently, semiconductor device lifetimes could be measured in decades, which was essentially infinite with respect to their required service lives. It was, therefore, not critical to quantify the device lifetimes exactly, or even to understand them completely. For avionics, medical, military, and even telecommunications applications, it was reasonable to assume that all devices would have constant and relatively low failure rates throughout the life of the system; this assumption was built into the design, as well as reliability and safety analysis processes.

NASA Office Of Safety And Mission Assurance

Nanoelectromechanical Switches for Low-Power Digital Computing

Technical Library | 2017-03-02 18:13:05.0

The need for more energy-efficient solid-state switches beyond complementary metal-oxide-semiconductor (CMOS) transistors has become a major concern as the power consumption of electronic integrated circuits (ICs) steadily increases with technology scaling. Nano-Electro-Mechanical (NEM) relays control current flow by nanometer-scale motion to make or break physical contact between electrodes, and offer advantages over transistors for low-power digital logic applications: virtually zero leakage current for negligible static power consumption; the ability to operate with very small voltage signals for low dynamic power consumption; and robustness against harsh environments such as extreme temperatures. Therefore, NEM logic switches (relays) have been investigated by several research groups during the past decade. Circuit simulations calibrated to experimental data indicate that scaled relay technology can overcome the energy-efficiency limit of CMOS technology. This paper reviews recent progress toward this goal, providing an overview of the different relay designs and experimental results achieved by various research groups, as well as of relay-based IC design principles. Remaining challenges for realizing the promise of nano-mechanical computing, and ongoing efforts to address these, are discussed.

EECS at University of California

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