Technical Library: tri 3d aoi (Page 1 of 1)

How Does 3D AOI Increase Manufacturing Quality?

Technical Library | 2017-08-28 17:14:41.0

PCB suppliers in the automotive space are vastly accelerating their time to market by using automated optical inspection (AOI) systems during PCB assembly. However, this next-generation technique is not limited in scope to the automotive industry – it has powerful implications for the entire PCB industry.

Power Design Services

With Koh Young, Matric Group Delivers Breakthrough Operational Improvements

Technical Library | 2023-10-19 22:03:14.0

Koh Young Technology, the industry leader in True 3D measurement-based inspection solutions, proudly releases another customer success story with Matric Group. This case study shows how Matric Group has leveraged their partnership with Koh Young to be one of the first in the industry to use pre-reflow AOI as a game-changer for line efficiency and improved yield. All while creating a central inspection war room to allow just one person to manage all inline inspection, increasing automation, and control and mitigating talent shortages.

Koh Young America, Inc.

Packaging Technology and Design Challenge for Fine Pitch Micro-Bump Cu-Pillar and BOT (Direct Bond on Substrate-Trace) Using TCNCP

Technical Library | 2015-12-02 18:32:50.0

(Thermal Compression with Non-Conductive Paste Underfill) Method.The companies writing this paper have jointly developed Copper (Cu) Pillar micro-bump and TCNCP(Thermal Compression with Non-Conductive Paste) technology over the last two+ years. The Cu Pillar micro-bump and TCNCP is one of the platform technologies, which is essentially required for 2.5D/3D chip stacking as well as cost effective SFF (small form factor) package enablement.Although the baseline packaging process methodology for a normal pad pitch (i.e. inline 50μm) within smaller chip size (i.e. 100 mm2) has been established and are in use for HVM production, there are several challenges to be addressed for further development for commercialization of finer bump pitch with larger die (i.e. ≤50μm tri-tier bond pad with the die larger than 400mm2).This paper will address the key challenges of each field, such as the Cu trace design on a substrate for robust micro-joint reliability, TCNCP technology, and substrate technology (i.e. structure, surface finish). Technical recommendations based on the lessons learned from a series of process experimentation will be provided, as well. Finally, this technology has been used for the successful launching of the company FPGA products with SFF packaging technology.

Altera Corporation

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