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Industry News: flying probe supporter can not locate top position (Page 1 of 1)

ECT Introduces A7 Flying Probe Test System from atg-LM

Industry News | 2012-04-30 14:15:09.0

Everett Charles Technologies (ECT) introduces the new A7Cf Flying Probe Test System from atg-LM. The double-sided test system features four probes on top and four additional probes on the bottom

Everett Charles Technologies (acquired by LTX-Credence, which was acquired by Cohu)

TAKAYA Launches APT-1600FD-SL, Dual-Sided Flying Probe Tester with Big Board Handling Capability, Advanced Features

Industry News | 2021-06-30 04:21:06.0

Takaya's APT-1600FD-SL Dual Sided Flying Probe test system for assembled PCBAs delivers both high speed and a larger testing area designed to accommodate large PCBAs for the emerging markets of 5G communications and BMS (Battery Management System) applications. The "-SL" series provides a 48% larger test area, which aligns perfectly with applications including semi conductor test probe card manufacturers. These customers urged Takaya to increase the test area of their dual-sided system.

Texmac, Inc.

GOEPEL electronic Appoints Datest Corp. As Next Center of Expertise

Industry News | 2010-08-23 14:14:21.0

GOEPEL electronic has appointed Datest Corp. as Center of Expertise (COE) for the service and support of the company’s worldwide unrivalled JTAG/Boundary Scan technology compliant with IEEE Std. 1149.x.

Datest

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