Industry News | 2010-08-27 23:51:07.0
WATERTOWN, MA - Devoted to the development of new radiation detector and systems technology, RMD Instruments Corp. announces that Jack Paster and Steve Glass will present a paper titled "Understanding XRF Technology and its Application to Improve Supply Chain Component Reliability through Counterfeit (Sub-Standard) Verification and Comparative Analysis" at the upcoming PCB West Conference & Exhibition.
Industry News | 2011-03-09 21:57:49.0
The CBA Group, comprised of Universal Instruments Corporation and Hover-Davis, announces the appointment of Debbora (Deb) Ahlgren as Vice President of Marketing, reporting to Jean-Luc Pelissier, CEO and President of CBA, Universal Instruments and Hover-Davis.
Industry News | 2015-04-03 15:48:41.0
J750-LitePoint Solutions Lower Test Costs for Wireless Connectivity and RF SOC Devices
Industry News | 2014-05-08 10:42:32.0
Visual Inspection Instrument manufacturer Optilia Instruments AB announces the appointment of Ascentech LLC as North American Distributor. The agreement encompasses Optilia's BGA solder Inspection system and high-definition (full HD) camera inspection systems to the electronics manufacturing industry.
Industry News | 2016-07-30 19:22:36.0
Ascentech LLC will exhibit and demonstrate new test and process optimization instruments and solutions at the upcoming SMTA Ohio Expo & Tech Forum August 4th 2016 in Independence (Cleveland) Ohio.
Industry News | 2016-09-08 13:43:04.0
Ascentech, LLC will exhibit and demonstrate new test and process optimization instruments and solutions at the upcoming SMTA International Conference and Exhibition in Rosemont, IL, Sep. 25 - 29, 2016. Ascentech will exhibit these new products in booth #219.
Industry News | 2016-10-20 20:14:39.0
DEN-ON INSTRUMENTS is pleased to announce that its Factory Manager – Mr. Masaaki Uchiyama, is the company’s longest term employee. Mr. Uchiyama started with DEN-ON right after high school at 16 years old and, 28 years later, he is the longest term employee in DEN-ON’s 53-year history.
Industry News | 2003-02-26 08:15:52.0
With the Multisim VI Library, educators and students now can more easily design, simulate, measure and test electronic circuits in an integrated software and hardware environment.
Industry News | 2008-06-12 21:49:07.0
ScanWorks� integration into Cadence Encounter Digital IC Design Flow to provide deeper view into complex, packaged chips
Industry News | 2008-10-07 11:11:04.0
Accurate to 0.05% of full scale, the original 1988 instrument design was very well executed. However vintage 1980's state of the art electronic components were going end-of-life at an alarming rate.
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