Industry News: instruments 2785 230 (Page 1 of 1)

VOLUNTEERS HONORED FOR CONTRIBUTIONS TO ELECTRONICS INDUSTRY AND IPC More than 150 awards presented at IPC APEX EXPO 2014

Industry News | 2014-03-28 09:54:48.0

IPC – Association Connecting Electronics Industries® presented Committee Leadership, Distinguished Committee Service and Special Recognition Awards at IPC APEX EXPO® at Mandalay Bay Convention Center in Las Vegas.

Association Connecting Electronics Industries (IPC)

Press preview for Seica S.p.A. participation at FIEE 2015, March 23 – 27 2015, Booth 230, San Paolo - Brasil

Industry News | 2015-03-18 21:33:51.0

Seica will be present in the Arbitec Booth, partner for Brazil, where everyone is invited to see the new ATE/instrument MINI 80, the smallest rack-mountable and powerful ATE, with full in-circuit and functional test capabilities enclosed in a box of the same size of a DVD player. The solution can be used as stand-alone or as add-on tool for more complex tester architectures.

SEICA SpA

Gen3 Systems Invites Customers to Learn About Solderability Testing at S.E.E. Stockholm

Industry News | 2016-04-12 08:24:44.0

Gen3 Systems Limited is pleased to announce that it will exhibit at the S.E.E. show in Stockholm, scheduled to take place April 19-21 at the Kista Expo Center. Gen3 will showcase its solderability and contamination testers with its Swedish distributor, ESD Centre, in Booth CO2:30.

Gen3 Systems

CONSIDER MACHINE VISION FOR SURFACE MEASUREMENT OBSOLETE

Industry News | 2011-06-14 14:37:55.0

The white light axial chromatism technique utilized by Nanovea’s 3D Non Contact Profilometers has become widely known as a vital bench top research and verification tool. It is now the Automated Optical Inspection (AOI) environments that have begun to acknowledge Nanovea’s superior capability. Unlike the traditional vision and laser systems that typically sacrifice one feature for another, speed or resolution, Nanovea provides both. Vision and laser systems also have very limited automated surface measurement options, where as Nanovea’s system provides a wide range including: Profile, Dimension, Roughness, Shape & Form, Flatness & Planarity, Volume Area, Step-Height Depth and Thickness. And keep in mind, the technique utilized by Nanovea’s inspection system has the superior ability to measure nearly any material surface and zero influence from sample reflectivity or absorption.

NANOVEA

Omni Pro Electronics to Distribute New Altech All-In-One UPS Power Solution

Industry News | 2022-05-28 17:55:52.0

New Altech CBI Series is One Device that can be used as a Power Supply Unit, Battery Charger, Battery Care Module or Backup Module

New Yorker Electronics

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