Industry News: sir test (Page 3 of 12)

STI Electronics Inc’s SIR Test Protocol Receives Prestigious Global Technology Award

Industry News | 2010-10-27 18:18:54.0

STI Electronics, Inc., a full service organization providing training, electronic and industrial distribution, consulting, laboratory analysis, prototyping, and small- to medium-volume PCB assembly, announces that it has been awarded a Global Technology Award in the category of Contract Services

STI Electronics

STI Electronics’ Casey Cooper to Discuss SIR Test Protocols at the 2011 Pan Pacific Microelectronics Symposium

Industry News | 2010-12-09 13:15:01.0

STI Electronics announces that Casey Cooper, Electrical Engineering/Microelectronics Lab Manager, will present "Conformal Coating Evaluation for Use in Harsh Environments Utilizing a Modified SIR Test Protocol" at the upcoming Pan Pacific Microelectronics Symposium & Tabletop Exhibition, scheduled to take place January 18-20, 2011at the Hapuna Beach Prince Hotel on the Big Island of Hawaii.

STI Electronics

Magnalytix® Provides Inside Expert Knowledge with New Tech Corner

Industry News | 2021-01-27 04:42:24.0

Magnalytix, the forefront driver in providing real-time reliability solutions for electronics manufacturing, introduces the Magnalytix Technical Library, anenhancedknowledge base located initsWebsite's Tech Corner. The latest update connects manufacturing engineers with free inside expert knowledge regarding SIR testing and more.

Magnalytix

Practical Components' New Kit Checks Out Process Cleanliness & Residue

Industry News | 2009-02-06 02:51:30.0

LOS ALAMITOS, CA � February 2009 � Practical Components Inc., the leading supplier of dummy components, announces that the new Practical Components B-52 CRET (Cleanliness & Residue Evaluation Test) Kit is designed to help determine the ionic cleanliness of a customer's manufacturing process. The test boards and components follow guidelines associated with the IPC-B-52 Test Vehicle.

Practical Components, Inc.

Save the Date and Mark Your Calendars

Industry News | 2020-03-12 06:20:11.0

STI's Mark McMeen, VP, Engineering Services, will have a special presentation on How does one collect "Objective Evidence" to meet the new J-STD-001 Section 8.1 on electronic assembly cleanliness? The presentation take place at STI Electronics Inc.'s facility in Madison, AL on March 26, 2020 at 3 p.m. and will explore why this IPC standard came about and why the current "ROSE" test methodology is not enough for today's advanced designs. It will explore different tools and techniques as well as discuss how to gather objective evidence needed to meet the specification. There will be an actual demonstration of the equipment and test reports that are generated by the SIR test equipment along with the actual hardware that generates the test data that supports "Objective Evidence" for review. Do you know how "clean or dirty" your electronic manufacturing process and resulting hardware/assemblies are at completion?

STI Electronics

NEW: AutoSIR2 + and AutoCAF2+ Optimising Test Flexibility

Industry News | 2018-12-13 10:32:16.0

SIR and CAF testing have become significant demands by the industry in the drive to improve and enhance electronic circuit reliability.

Gen3 Systems

Gen3 Systems Marks 30 Years as a Provider of Solderability, SIR, CAF and Cleanliness Testing

Industry News | 2015-03-05 10:32:22.0

Gen3 Systems Limited is pleased to announce the company’s 30th anniversary. Since 1985, Gen3 Systems has been providing training and comprehensive in-house services for solderability, SIR, CAF and cleanliness testing.

Gen3 Systems

Gen3 Systems to Present SIR Intercomparison to Validate the use of a Fine Pitch Pattern

Industry News | 2017-02-09 08:35:06.0

FARNBOROUGH, UK ― February 2017 ― Gen3 Systems Limited, a specialist British manufacturer and distributor, is pleased to announce that its Chief Technology Officer Dr Chris Hunt will present the paper titled “SIR intercomparison to validate the use of fine pitch pattern” at the upcoming IPC APEX EXPO. The presentation will be held during the session titled “SIR/Flux Reliability” on Tuesday the 14th February between 15:30 – 17:00pm in location 4.

Gen3 Systems

Kester Launches SELECT-10™ Selective Solder Flux

Industry News | 2016-04-22 10:20:35.0

Kester is proud to announce the launch of SELECT-10™Selective Solder Flux, a zero-halogen no-clean liquid flux designed specifically for the needs of the selective soldering process. As part of Kester’s portfolio of high reliability products, SELECT-10™ has passed IPC SIR testing as a raw and partially activated flux. Sustained activity within the flux allows for good barrel fill in challenging and high temperature applications. Specific to selective soldering, SELECT-10™ does not spread beyond the spray pattern and will not clog nozzles. SELECT-10™ is classified as ROL0 flux under IPC J-STD-004B.

Kester

New NPL Method for Testing Reliability of Electronics in Condensing Environment FREE Webinar

Industry News | 2016-09-06 12:39:58.0

NPL have developed a new test method to control the rate of condensation on to printed board assemblies during environmental testing like SIR or conformal coating assessment

ASKbobwillis.com


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